Abstract

An investigation has been made of Ilford Q as to the sensitivity dependence of the ion mass, ion energy, and the developing time, using a second order mass spectrometer with an electron impact source. Description and analysis of the results obtained are represented in this paper. It was found that the experimental data agree reasonably well with the suggested empirical equation.

Comparison of the exposure characteristics of soft-x-ray film SIOFM-5FW with Kodak 101-05 and Ilford Q-plates

Pin-zhong Fan, Jin-zhi Zhou, and Yue-lin Li
Appl. Opt. 36(13) 2843-2847 (1997)

Cost-effective mass fabrication of multilevel diffractive optical elements by use of a single optical exposure with a gray-scale mask on high-energy beam-sensitive glass

Walter Däschner, Pin Long, Robert Stein, Chuck Wu, and S. H. Lee
Appl. Opt. 36(20) 4675-4680 (1997)

Chemical ionization Fourier transform mass spectrometry of chemical warfare agent simulants using laser-produced metal ions

Chih-Cong Chou and S. Randolph Long
Appl. Opt. 29(33) 4981-4986 (1990)

Absolute Sensitivity Measurements on Single-Grain-Layer Photographic Plates for Different Wave-Lengths*

J. H. Webb
J. Opt. Soc. Am. 38(4) 312-323 (1948)

The Mechanism of Latent Image Formation in a Photographic Emulsion by Mechanical Pressure*

K. B. Mather
J. Opt. Soc. Am. 38(12) 1054-1064 (1948)