Abstract

Equations are presented for obtaining greatest precision from available counting time, and minimum counting time for a specified precision in quantitative x-ray spectroscopic analyses. The equations are derived for analytical situations involving determination of the net peak intensity of a line above background and the ratio of the net peak intensities of two lines above one and two backgrounds. Graphical solutions are provided for some of the equations.

Performance of a flat-field grating spectrometer for tender x-ray emission spectroscopy

Takashi Imazono, Ryuichi Ukita, Hiroaki Nishihara, Hiroyuki Sasai, and Tetsuya Nagano
Appl. Opt. 57(27) 7770-7777 (2018)

Spectroscopy of x-ray lasers

R. H. Dixon and R. C. Elton
J. Opt. Soc. Am. B 1(2) 232-238 (1984)

Reconstruction strategy suited to x-ray diffraction tomography

J. A. Grant, M. J. Morgan, J. R. Davis, and P. Wells
J. Opt. Soc. Am. A 12(2) 291-300 (1995)

Seeded stimulated X-ray emission at 5.9 keV

Margaret D. Doyle, Aliaksei Halavanau, Yu Zhang, Yurina Michine, Joshua Everts, Franklin Fuller, Roberto Alonso-Mori, Makina Yabashi, Ichiro Inoue, Taito Osaka, Jumpei Yamada, Yuichi Inubushi, Toru Hara, Jan Kern, Junko Yano, Vittal K. Yachandra, Nina Rohringer, Hitoki Yoneda, Thomas Kroll, Claudio Pellegrini, and Uwe Bergmann
Optica 10(4) 513-519 (2023)

X-Ray Spectroscopy as a Control Method in the Production of Zirconium and Hafnium

D. M. Mortimore and P. A. Romans
J. Opt. Soc. Am. 42(9) 673-677 (1952)