Abstract

Calculation methods for quantitative analysis, energy dispersion, and inhomogeneous samples are current areas in x-ray analysis which offer hope of reducing analysis costs. Other areas which extend the capabilities of x-ray analysis include improved analyzer crystals, diffraction gratings, and effects of valence on spectral lines. Electron spectrometry promises to be a valuable technique for low atomic number elements.

Joint reconstruction of x-ray fluorescence and transmission tomography

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Hyperspectral image reconstruction for x-ray fluorescence tomography

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Reflection zone plate concept for resonant inelastic x-ray scattering spectrometry

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Quantitative analysis of energy-dispersive X-ray fluorescence spectroscopy based on machine learning and a generative data enhancement technique

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Simultaneous X-ray fluorescence and ptychographic microscopy of Cyclotella meneghiniana

D. J. Vine, D. Pelliccia, C. Holzner, S. B. Baines, A. Berry, I. McNulty, S. Vogt, A. G. Peele, and K. A. Nugent
Opt. Express 20(16) 18287-18296 (2012)