Abstract

A specular reflectance system for the infrared analysis of micro size samples is described and its advantages and limitations compared to other micro infrared techniques. Samples are mounted on small metal mirrors which reflect the light beam back through the sample. A transmission spectrum of the sample is thereby obtained but the effective path length is twice that of the actual thickness. A given absorption band therefore has twice the absorbance obtained by conventional transmission measurements The system has been applied mainly to gas chromatographic fractions but should be suitable to a variety of other analyses. Major limitations include a "stray light" artifact, polymorphism effects, and difficulties in achieving sample uniformity.

Symmetry X system and method for absolute measurements of reflectance and transmittance of specular samples

Etsuo Kawate
Appl. Opt. 42(25) 5064-5072 (2003)

Integrating-sphere system and method for absolute measurement of transmittance, reflectance, and absorptance of specular samples

Leonard Hanssen
Appl. Opt. 40(19) 3196-3204 (2001)

Infrared specular reflectance of pressed crystal powders and mixtures

Frederic E. Volz
Appl. Opt. 22(12) 1842-1855 (1983)

Specular reflectance of optical-black coatings in the far infrared

Sheldon M. Smith
Appl. Opt. 23(14) 2311-2326 (1984)

Reflectance of Perfect Diffuse and Specular Samples in the Integrating Sphere

Bjarne J. Hisdal
J. Opt. Soc. Am. 55(9) 1122-1125 (1965)