Abstract

Experiments recently performed by the National Bureau of Standards provide data on the photographic response of commercial X-ray films at unusually high rates of exposure. Films of this kind are now used extensively for measuring X- and gamma ray exposures. To interpret film densities in terms of exposure, however, a knowledge of film characteristics as determined under controlled laboratory conditions is required. By adding to this knowledge, the present study should help increase the reliability of such interpretations. The work was supported by the U.S. Atomic Energy Commission and the U.S. Army Signal Corps, and the experiments were conducted by Margarete Ehrlich and W. L. McLaughlin of the Bureau's radiation physics laboratory.

Low-energy x-ray response of photographic films. I. Mathematical models

B. L. Henke, S. L. Kwok, J. Y. Uejio, H. T. Yamada, and G. C. Young
J. Opt. Soc. Am. B 1(6) 818-827 (1984)

High-energy x-ray response of photographic films: models and measurement

B. L. Henke, J. Y. Uejio, G. F. Stone, C. H. Dittmore, and F. G. Fujiwara
J. Opt. Soc. Am. B 3(11) 1540-1550 (1986)

Low-energy x-ray response of photographic films. II. Experimental characterization

B. L. Henke, F. G. Fujiwara, M. A. Tester, C. H. Dittmore, and M. A. Palmer
J. Opt. Soc. Am. B 1(6) 828-849 (1984)

Reciprocity Law for X-Rays.* Part I: Validity for High-Intensity Exposures in the Negative Region

Margarete Ehrlich and William L. McLaughlin
J. Opt. Soc. Am. 46(10) 797-800 (1956)

Sensitivity of Photographic Films to X-Rays at Low Temperatures

G. E. M. Jauncey and H. W. Richardson
J. Opt. Soc. Am. 24(5) 125-126 (1934)