Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 55,
  • Issue 6,
  • pp. 722-729
  • (2001)

Precision and Noise in Inductively Coupled Plasma Atomic Emission Spectroscopy with Charge-Injection Device Detection

Not Accessible

Your library or personal account may give you access

Abstract

An inductively coupled plasma (ICP)-echelle optical system coupled with a charge-injection device (CID) detector was evaluated for precision and noise. Simultaneous collection of analyte wavelengths and simultaneous background correction have invalidated underlying assumptions in some traditional models. Signal flicker noise, a major limitation in single-channel detection, was eliminated by the time correlation of analyte and internal standard wavelengths. Once flicker noise was eliminated, most fluctuation was found to be caused by slight wavelength shifts along the axis of the detector, rather than by the theoretically predicted signal shot noise. This fluctuation can be corrected by increasing center subarray sizes or by employing well-matched internal standard lines. In either case, precision of 0.3 to 0.18% relative standard deviation (RSD) was achieved over a time span of 7 h. Background flicker noise was also eliminated by simultaneous background correction, demonstrating a multichannel advantage of ICP detection using charge-transfer devices. In this work, theoretical expressions were developed to incorporate major sources of noise based on the specific readout characteristics of an array detector. These expressions match experimental data extremely well for measurement of relative standard deviation in background (RSDB) and detection limits. These data have then been compared to the single-channel case, which describes photomultiplier tube (PMT) detection, as well as the theoretical limit dictated by background shot noise.

PDF Article
More Like This
Charge-injection-device 2 × 64 element infrared array performance

Mark E. McKelvey, Craig R. McCreight, John H. Goebel, and A. Arlo Reeves
Appl. Opt. 24(16) 2549-2557 (1985)

Infrared charge-injection-device array performance at low background

C. R. McCreight and J. H. Goebel
Appl. Opt. 20(18) 3189-3196 (1981)

Quantitative analysis of Fuller’s earth using laser-induced breakdown spectroscopy and inductively coupled plasma/optical emission spectroscopy

I. Rehan, M. Z. Khan, K. Rehan, S. Sultana, M. U. Rehman, R. Muhammad, M. Ikram, and H. Anwar
Appl. Opt. 58(16) 4227-4233 (2019)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.