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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 46,
  • Issue 1,
  • pp. 131-135
  • (1992)

An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers

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Abstract

The variable-exit-angle ultrasoft x-ray fluorescence technique has been evaluated for Ni/Fe thin-film multilayers. The theoretical and experimental agreement is reasonable. The experimental results demonstrate that on these Ni/Fe samples quantitative information can be obtained in the presence of surface contamination.

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