Abstract

Thermal-induced infrared emission spectroscopy is reviewed, with emphasis on developments in theory and experiment. The theory associated with obtaining thermal-induced infrared emittance spectra as a function of sampling optics is discussed. The FT-IR configuration and data reduction methods needed to properly obtain high-quality spectra, close to room temperature, are also considered. Optical and experimental parameters which affect the spectrum are demonstrated by example, with a discussion of methods which optimize the signal-to-noise ratio. The applications shown range from polymer films on both metal and semiconductor surfaces to a single filament analyzed by micro-emission spectroscopy.

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