Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 41,
  • Issue 8,
  • pp. 1303-1306
  • (1987)

Dynamic Range Problems in Fourier Transform IR and Far-IR Spectroscopy

Not Accessible

Your library or personal account may give you access

Abstract

The exploitation of both the multiplex and the aperture advantage in Fourier transform IR and far-IR spectroscopy may lead to nonlinear detector response or saturation of the A/D converter. This limitation of the dynamic range only concerns the center-burst peak of the interferogram function. After the Fourier transformation, the respective distortion in the frequency or—better—wavenumber domain is completely delocalized. Erroneous intensity contributions are, in principle, present in all parts of the spectrum under consideration. Thus, it is not easy to diagnose the effect of a limited dynamic range. Practical procedures for the recognition and elimination of the respective artifacts in the spectrum are, therefore, suggested; they are to be used in conjunction with the application of the IR transmission technique to surface studies of high-surface-area SiO<sub>2</sub>.

PDF Article
More Like This
High-Resolution Fourier Transform Spectroscopy in the Far-Infrared

P. L. Richards
J. Opt. Soc. Am. 54(12) 1474-1484 (1964)

Source of a problem with Fourier transform spectroscopy

D. B. Tanner and R. P. McCall
Appl. Opt. 23(14) 2363-2368 (1984)

All-reflection Michelson interferometer: analysis and test for far ir Fourier spectroscopy

R. J. Fonck, D. A. Huppler, F. L. Roesler, D. H. Tracy, and Mark Daehler
Appl. Opt. 17(11) 1739-1747 (1978)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved