Abstract

Diffuse reflectance measurements are becoming increasingly popular as a method for obtaining IR spectra. One reason for this is that sample preparation is rather simple compared with, for example, production of a KBr disc. Here we report a technique which allows samples to be prepared in a few seconds from a wide variety of materials.

Technique for measuring the reflectance of irregular, submillimeter-sized samples

Christopher C. Homes, M. Reedyk, D. A. Cradles, and T. Timusk
Appl. Opt. 32(16) 2976-2983 (1993)

International comparison of measurements of luminance factor and reflectance of white diffusing samples

V. E. Kartachevskaya, H. Korte, and A. R. Robertson
Appl. Opt. 14(11) 2694-2702 (1975)

Measuring absolute diffuse reflectance in the ultraviolet

James B. Gillespie and James D. Lindberg
Appl. Opt. 31(7) 955-959 (1992)

Witness sample preparation for measuring antireflection coatings

Ronald R. Willey
Appl. Opt. 53(4) A52-A55 (2014)

Hyperspectral diffuse reflectance imaging for rapid, noncontact measurement of the optical properties of turbid materials

Jianwei Qin and Renfu Lu
Appl. Opt. 45(32) 8366-8373 (2006)