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Applied Optics Feature Announcement

Correlation Optics

Submissions Open: 1 October 2015

Submission Deadline: 1 November 2015

The 12th International Conference on Correlation Optics will be held in September 2015 in Chernivtsi, Ukraine. Since 1993, this biannual conference found a wide circle of permanent interested participants from more than two dozen countries over the world due to optical correlation techniques (including regular and polarization interferometry, interference and diffraction microscopy, specklometry, holographic correlometry, fractal optics, and measurement of optical chaos and optical singularities) constituting promising and avalanche-like developed areas of optical information technologies. Such techniques serve to solve diverse applied problems ranging from industrial quality control to modern telecommunications and life sciences.

This feature issue will cover the following topics:

  • Singular optics
  • Informative content of statistical optical fields, including optical chaos, singular optics, polarization optics and coherence
  • Optical correlation devices based on diffractive optical elements, including optical and digital holography, fractal optics, optical sensors
  • Optical correlation diagnostics, interferometry and microscopy of rough surfaces and random media
  • New applications of correlation optics in biology and medicine; Optical techniques, systems and elements for telecommunications

These topics cover both fundamental and applied aspects of correlation optics.

Manuscripts must be prepared according to the usual standards for submission to Applied Optics; see the Information for Contributors in any printed issue or the OSA Style Guide. Manuscripts must also be uploaded through OSA's electronic submission system. Please specify that the manuscript is for the Correlation Optics 2015 feature (choose from the feature issue drop-down menu).

Feature Issue Editors

Oleg V. Angelsky, Chernivtsi National University, Ukraine (Lead)
Anton Desyatnikov, Australian National University, Australia
Gregory J. Gbur, University of North Carolina at Charlotte, USA
Steen G. Hanson, DTU Fotonik, Denmark
Tim Lee, University of British Columbia
Yoko Miyamoto, University of Electro-Communications, Japan
Herbert Schnekenburger, Aalen University, Germany
James Wyant, University of Arizona