Expand this Topic clickable element to expand a topic
OSA Publishing

1 November 2019, Volume 58, Issue 31, pp. 8344-8718   46 articles

Sort:

Terahertz and X-ray Optics

Absolute metrology method of the x-ray mirror with speckle scanning technique

Appl. Opt. 58(31), 8658-8664 (2019)  View: HTML | PDF

Select as filters


    Select Topics Cancel
    © Copyright 2019 | The Optical Society. All Rights Reserved