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OSA Publishing

20 May 2017, Volume 56, Issue 15, pp. 4224-4576   48 articles


Instrumentation, Measurement, and Metrology

Self-calibrating phase-shifting interferometry of three unequal phase steps by fitting background light to a polynomial of degree K

Appl. Opt. 56(15), 4278-4283 (2017)  View: HTML | PDF

Movement flatness error measurement based on an astigmatic method

Appl. Opt. 56(15), 4347-4352 (2017)  View: HTML | PDF

Correction of numerical aperture effect on reflection phase measurement using a thick-gap Fabry–Perot etalon

Appl. Opt. 56(15), 4392-4397 (2017)  View: HTML | PDF

Calibration and data extraction in nonoptimized Mueller matrix polarimeters

Appl. Opt. 56(15), 4398-4405 (2017)  View: HTML | PDF

Experimental evaluation of a 3D wavelet-based phase recovery method in temporal speckle pattern interferometry

Appl. Opt. 56(15), 4412-4418 (2017)  View: HTML | PDF

Utilization of complex-valued signals in a white-light scanning interferometer for accurate measurement of a surface profile

Appl. Opt. 56(15), 4419-4425 (2017)  View: HTML | PDF

Optimization method of star tracker orientation for sun-synchronous orbit based on space light distribution

Appl. Opt. 56(15), 4480-4490 (2017)  View: HTML | PDF

Method for simultaneously calibrating peak retardation and static retardation of a photoelastic modulator

Appl. Opt. 56(15), 4491-4495 (2017)  View: HTML | PDF

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