20 January 2005, Volume 44, Issue 3, pp. 297-466  
18 articles

Formulation and implementation of a phase-resolved fluorescence technique for latent-fingerprint imaging: theoretical and experimental analysis

Appl. Opt. 44(3), 297-304 (2005)  View: HTML | PDF

Scalable high-resolution integral videography autostereoscopic display with a seamless multiprojection system

Appl. Opt. 44(3), 305-315 (2005)  View: HTML | PDF

Michelson wide-field stellar interferometry: principles and experimental verification

Appl. Opt. 44(3), 328-336 (2005)  View: HTML | PDF

Some opportunities for vibration analysis with time averaging in digital Fresnel holography

Appl. Opt. 44(3), 337-343 (2005)  View: HTML | PDF

Characterization of depolarizing optical media by means of the entropy factor: application to biological tissues

Appl. Opt. 44(3), 358-365 (2005)  View: HTML | PDF

Low-coherent backscattering spectroscopy for tissue characterization

Appl. Opt. 44(3), 366-377 (2005)  View: HTML | PDF

Study of normal incidence of three-component multilayer mirrors in the range 20–40 nm

Appl. Opt. 44(3), 384-390 (2005)  View: HTML | PDF

Long-range detection and length estimation of light filaments using extra-attenuation of terawatt femtosecond laser pulses propagating in air

Appl. Opt. 44(3), 391-397 (2005)  View: HTML | PDF

Measurements of the infrared emissivity of a wind-roughened sea surface

Appl. Opt. 44(3), 398-411 (2005)  View: HTML | PDF

Optical detection of rapidly moving objects in space

Appl. Opt. 44(3), 423-433 (2005)  View: HTML | PDF

Airborne system for fast measurements of upwelling and downwelling spectral actinic flux densities

Appl. Opt. 44(3), 434-444 (2005)  View: HTML | PDF

Simultaneous planar laser-induced incandescence, OH planar laser-induced fluorescence, and droplet Mie scattering in swirl-stabilized spray flames

Appl. Opt. 44(3), 445-454 (2005)  View: HTML | PDF

Retrieval of trace gases from aerosol-influenced infrared transmission spectra observed by low-spectral-resolution Fourier-transform spectrometers

Appl. Opt. 44(3), 455-466 (2005)  View: HTML | PDF