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Applied Optics

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Applied Optics

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10 September 2005, Volume 44, Issue 26, pp. 5359-5603 31 articles

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Appl. Opt. 44(26), 5359-5360 (2005) View: HTML | PDF

Effect of surface roughness and complex indices of refraction on polarized thermal emission

Kristan P. Gurton and Rachid Dahmani

Appl. Opt. 44(26), 5361-5367 (2005) View: HTML | PDF

In-fiber reflection mode interferometer based on a long-period grating for external refractive-index measurement

Dae Woong Kim, Yan Zhang, Kristie L. Cooper, and Anbo Wang

Appl. Opt. 44(26), 5368-5373 (2005) View: HTML | PDF

Multichannel radiometer calibration: a new approach

Susana Diaz, Charles R. Booth, Roy Armstrong, Claudio Brunat, Sergio Cabrera, Carolina Camilion, Claudio Casiccia, Guillermo Deferrari, Humberto Fuenzalida, Charlotte Lovengreen, Alejandro Paladini, Jorge Pedroni, Alejandro Rosales, Horacio Zagarese, and Maria Vernet

Appl. Opt. 44(26), 5374-5380 (2005) View: HTML | PDF

Reconstruction of the concentration field around a growing KDP crystal with schlieren tomography

Atul Srivastava, K. Muralidhar, and P. K. Panigrahi

Appl. Opt. 44(26), 5381-5392 (2005) View: HTML | PDF

Optical approach to angular displacement measurement based on attenuated total reflection

Fan Chen, Zhuangqi Cao, Qishun Shen, and Yaojun Feng

Appl. Opt. 44(26), 5393-5397 (2005) View: HTML | PDF

Performance uniformity analysis of a wire-grid polarizer in imaging polarimetry

Donghyun Kim

Appl. Opt. 44(26), 5398-5402 (2005) View: HTML | PDF

Phase-shifting interferometry with equal phase steps by use of a frequency-tunable diode laser and a Fabry–Perot cavity

Youichi Bitou, Hajime Inaba, Feng-Lei Hong, Toshiyuki Takatsuji, and Atsushi Onae