2 December 2002, Volume 41, Issue 34, pp. 7155-7358  
27 articles

Metrology of pulsed radiation for 157-nm lithography

Appl. Opt. 41(34), 7167-7172 (2002)  View: HTML | PDF

Characterization of an ultraviolet and a vacuum-ultraviolet irradiance meter with synchrotron radiation

Appl. Opt. 41(34), 7173-7178 (2002)  View: HTML | PDF

Sensitivity analysis of grating parameter estimation

Appl. Opt. 41(34), 7179-7186 (2002)  View: HTML | PDF

Phase-modulation scatterometry

Appl. Opt. 41(34), 7187-7192 (2002)  View: HTML | PDF

Interleaved, sampled fiber Bragg gratings for use in hybrid wavelength references

Appl. Opt. 41(34), 7193-7196 (2002)  View: HTML | PDF

Thermal stability of the 248-nm-induced presensitization process in standard H2-loaded germanosilicate fibers

Appl. Opt. 41(34), 7197-7204 (2002)  View: HTML | PDF

Design of a fiber-optic quasi-distributed strain sensors ring network based on a white-light interferometric multiplexing technique

Appl. Opt. 41(34), 7205-7211 (2002)  View: HTML | PDF

Dependence of the Brillouin gain spectrum on linear strain distribution for optical time-domain reflectometer-type strain sensors

Appl. Opt. 41(34), 7212-7217 (2002)  View: HTML | PDF

Conoscopic evaluation of the birefringence of gradient-index lenses: infidelity sources

Appl. Opt. 41(34), 7218-7228 (2002)  View: HTML | PDF

Strain contouring with Gabor filters: filter bank design

Appl. Opt. 41(34), 7229-7236 (2002)  View: HTML | PDF

Bending wave propagation in rotating objects measured by pulsed TV holography

Appl. Opt. 41(34), 7237-7240 (2002)  View: HTML | PDF

Characterization of a mixed sphere and film waveguide at the 1-µm scale by 0.67-µm laser light propagation

Appl. Opt. 41(34), 7241-7244 (2002)  View: HTML | PDF

Heterostructure photonic crystals: theory and applications

Appl. Opt. 41(34), 7245-7253 (2002)  View: HTML | PDF

Phase measurement in temporal speckle pattern interferometry: comparison between the phase-shifting and the Fourier transform methods

Appl. Opt. 41(34), 7254-7263 (2002)  View: HTML | PDF

Relations between the critical angles and the optical tensor of a biaxial material

Appl. Opt. 41(34), 7264-7274 (2002)  View: HTML | PDF

Nanosizing of fluorescent objects by spatially modulated illumination microscopy

Appl. Opt. 41(34), 7275-7283 (2002)  View: HTML | PDF

Comparison of exact pupil astigmatism conditions with Seidel approximations

Appl. Opt. 41(34), 7284-7287 (2002)  View: HTML | PDF

Application of the pupil astigmatism criteria in optical design

Appl. Opt. 41(34), 7288-7293 (2002)  View: HTML | PDF

Static and dynamic properties of highly turbid media determined by spatially resolved diffusive-wave spectroscopy

Appl. Opt. 41(34), 7294-7299 (2002)  View: HTML | PDF

Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films

Appl. Opt. 41(34), 7300-7308 (2002)  View: HTML | PDF

Measurements of the refractive index of yttrium in the 50–1300-eV energy region

Appl. Opt. 41(34), 7309-7316 (2002)  View: HTML | PDF

Method to measure the optical properties of small volumes of diffusive media

Appl. Opt. 41(34), 7317-7324 (2002)  View: HTML | PDF

Adaptive calibration for object localization in turbid media with interfering diffuse photon density waves

Appl. Opt. 41(34), 7325-7333 (2002)  View: HTML | PDF

Determination of bacterial activity by use of an evanescent-wave fiber-optic sensor

Appl. Opt. 41(34), 7334-7338 (2002)  View: HTML | PDF

Application of Fourier transform infrared ellipsometry to assess the concentration of biological molecules

Appl. Opt. 41(34), 7339-7345 (2002)  View: HTML | PDF

Semi-three-dimensional algorithm for time-resolved diffuse optical tomography by use of the generalized pulse spectrum technique

Appl. Opt. 41(34), 7346-7358 (2002)  View: HTML | PDF