OSA Publishing

1 October 2001, Volume 40, Issue 28, pp. 4921-5131   27 articles

Silicon nitride micromesh bolometer array for submillimeter astrophysics

Appl. Opt. 40(28), 4921-4932 (2001)  View: HTML | PDF

Depolarization and principal Mueller matrix measured by null ellipsometry

Appl. Opt. 40(28), 4933-4939 (2001)  View: HTML | PDF

High-resolution birefringence imaging in three-dimensional stressed models by Fourier polarimetry

Appl. Opt. 40(28), 4940-4946 (2001)  View: HTML | PDF

Vibrating knife-edge technique for measuring the focal length of a microlens

Appl. Opt. 40(28), 4947-4952 (2001)  View: HTML | PDF

Image upconversion from the visible to the UV domain: application to dynamic UV microstereolithography

Appl. Opt. 40(28), 4953-4957 (2001)  View: HTML | PDF

High-numerical-aperture scalar imaging

Appl. Opt. 40(28), 4958-4964 (2001)  View: HTML | PDF

Three-dimensional materials analysis by confocal Raman microspectroscopy

Appl. Opt. 40(28), 4965-4970 (2001)  View: HTML | PDF

Birefringence in gradient-index rod lenses: a direct measurement method and interferometric polarization effects

Appl. Opt. 40(28), 4971-4980 (2001)  View: HTML | PDF

Far-infrared Fizeau interferometry

Appl. Opt. 40(28), 4981-4987 (2001)  View: HTML | PDF

Readout and control of a power-recycled interferometric gravitational-wave antenna

Appl. Opt. 40(28), 4988-4998 (2001)  View: HTML | PDF

Shifting of localization planes in optical testing: application to a shearing interferometer

Appl. Opt. 40(28), 4999-5010 (2001)  View: HTML | PDF

Speckle interferometry: three-dimensional deformation field measurement with a single interferogram

Appl. Opt. 40(28), 5011-5022 (2001)  View: HTML | PDF

Stabilized phase-shifting fringe analysis by use of current-induced frequency modulation of laser diodes

Appl. Opt. 40(28), 5023-5027 (2001)  View: HTML | PDF

Bicorn filters with strong and broad rejection for single-mode waveguides

Appl. Opt. 40(28), 5028-5033 (2001)  View: HTML | PDF

On-line measurement of the thickness and optical quality of float glass with a sensor based on a diffractive element

Appl. Opt. 40(28), 5034-5039 (2001)  View: HTML | PDF

Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy

Appl. Opt. 40(28), 5040-5045 (2001)  View: HTML | PDF

Studies of digital microscopic holography with applications to microstructure testing

Appl. Opt. 40(28), 5046-5051 (2001)  View: HTML | PDF

Precise and simple optical alignment method for double-sided lithography

Appl. Opt. 40(28), 5052-5055 (2001)  View: HTML | PDF

Making an omnidirectional reflector

Appl. Opt. 40(28), 5056-5063 (2001)  View: HTML | PDF

Light scattering by wood fibers

Appl. Opt. 40(28), 5064-5077 (2001)  View: HTML | PDF

Response of Fourier-transform spectrometers to absorption and emission in a homogeneous single-layered beam splitter

Appl. Opt. 40(28), 5078-5087 (2001)  View: HTML | PDF

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

Appl. Opt. 40(28), 5088-5099 (2001)  View: HTML | PDF

Refractive lenses for coherent x-ray sources

Appl. Opt. 40(28), 5100-5105 (2001)  View: HTML | PDF

Pulsed digital holographic interferometry for dynamic measurement of rotating objects with an optical derotator

Appl. Opt. 40(28), 5106-5110 (2001)  View: HTML | PDF

Measuring the refractive index of thin liquid films with a spectrometer

Appl. Opt. 40(28), 5111-5113 (2001)  View: HTML | PDF

Characterizing mammalian cells and cell phantoms by polarized backscattering fiber-optic measurements

Appl. Opt. 40(28), 5114-5123 (2001)  View: HTML | PDF

Cancellation of coherent artifacts in optical coherence tomography imaging

Appl. Opt. 40(28), 5124-5131 (2001)  View: HTML | PDF

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