OSA Publishing

1 January 2000, Volume 39, Issue 1, pp. 9-192   25 articles

Interpolation of the spectral responsivity of silicon photodetectors in the near ultraviolet

Appl. Opt. 39(1), 9-15 (2000)  View: HTML | PDF

Contrast in the evanescent near field of λ/20 period gratings for photolithography

Appl. Opt. 39(1), 20-25 (2000)  View: HTML | PDF

Optical levitation particle delivery system for a dual beam fiber optic trap

Appl. Opt. 39(1), 26-33 (2000)  View: HTML | PDF

Aberrations from a prism and a grating

Appl. Opt. 39(1), 34-39 (2000)  View: HTML | PDF

Optical configuration and color-representation range of a variable-pitch dot matrix holographic printer

Appl. Opt. 39(1), 40-53 (2000)  View: HTML | PDF

High-resolution laser speckle correlation for displacement and strain measurement

Appl. Opt. 39(1), 54-60 (2000)  View: HTML | PDF

Three-dimensional shape measurement of a diffusing surface by use of a femtosecond amplifying optical Kerr gate

Appl. Opt. 39(1), 65-71 (2000)  View: HTML | PDF

Wave-front sensing with a sampling field sensor

Appl. Opt. 39(1), 72-84 (2000)  View: HTML | PDF

Design and experimental characterization of a high-resolution instrument for measuring the extreme-UV absorption of laser plasmas

Appl. Opt. 39(1), 85-93 (2000)  View: HTML | PDF

Calibration of a deformable mirror and Strehl ratio measurements by use of phase diversity

Appl. Opt. 39(1), 94-103 (2000)  View: HTML | PDF

Surface profilometry with laser-diode optical feedback interferometer outside optical benches

Appl. Opt. 39(1), 104-107 (2000)  View: HTML | PDF

High-accuracy Fourier transform interferometry, without oversampling, with a 1-bit analog-to-digital converter

Appl. Opt. 39(1), 108-113 (2000)  View: HTML | PDF

Heterodyne temporal speckle-pattern interferometry

Appl. Opt. 39(1), 114-117 (2000)  View: HTML | PDF

Interferometer for use in wave-front testing with a cross slit

Appl. Opt. 39(1), 118-123 (2000)  View: HTML | PDF

Guided wave acousto-optic and electro-optic tunable filter designs with relaxed beam-splitter requirements

Appl. Opt. 39(1), 124-128 (2000)  View: HTML | PDF

Optical contrast in apertureless microscopy

Appl. Opt. 39(1), 129-134 (2000)  View: HTML | PDF

Narrow-band interference filters with unconventional spacer layers

Appl. Opt. 39(1), 135-140 (2000)  View: HTML | PDF

Simple recurrence matrix relations for multilayer anisotropic thin films

Appl. Opt. 39(1), 141-148 (2000)  View: HTML | PDF

Preservation of far-UV aluminum reflectance by means of overcoating with C60 films

Appl. Opt. 39(1), 149-156 (2000)  View: HTML | PDF

High-rate automated deposition system for the manufacture of complex multilayer coatings

Appl. Opt. 39(1), 157-167 (2000)  View: HTML | PDF

Trichroic prism assembly for separating and recombining colors in a compact projection display

Appl. Opt. 39(1), 168-172 (2000)  View: HTML | PDF

Unbalanced versus balanced operation in an optical coherence tomography system

Appl. Opt. 39(1), 173-182 (2000)  View: HTML | PDF

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