1 October 1999, Volume 38, Issue 28, pp. 5911-6092  
26 articles

Patent Reviews: 5,767,998; 5,768,000; 5,784,170; 5,784,184; 5,796,501; 5,798,853; 5,812,306; 5,898,183; 5,898,502; 5,898,519; 5,903,000; 5,905,270; 5,905,567; 5,905,570; 5,905,808 5,906,429

Appl. Opt. 38(28), 5911-5913 (1999)  View: PDF

Interference effects in far-field diffractive optical elements

Appl. Opt. 38(28), 5915-5919 (1999)  View: HTML | PDF

Characterization of diffraction gratings in a rigorous domain with optical scatterometry: hierarchical neural-network model

Appl. Opt. 38(28), 5920-5930 (1999)  View: HTML | PDF

Phase-shifting method with a normal polariscope

Appl. Opt. 38(28), 5931-5935 (1999)  View: HTML | PDF

Sensor performance conversions for infrared target acquisition and intelligence–surveillance–reconnaissance imaging sensors

Appl. Opt. 38(28), 5936-5943 (1999)  View: HTML | PDF

Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Appl. Opt. 38(28), 5944-5947 (1999)  View: HTML | PDF

Corrosion monitoring with speckle correlation

Appl. Opt. 38(28), 5948-5955 (1999)  View: HTML | PDF

Dynamic measurements of internal three-dimensional displacement fields with digital speckle photography and flash x rays

Appl. Opt. 38(28), 5956-5961 (1999)  View: HTML | PDF

Telecentric three-dimensional sensor with a liquid mirror for large-object inspection

Appl. Opt. 38(28), 5962-5967 (1999)  View: HTML | PDF

Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

Appl. Opt. 38(28), 5968-5973 (1999)  View: HTML | PDF

Low-coherence interferometry with synthesis of coherence function

Appl. Opt. 38(28), 5974-5980 (1999)  View: HTML | PDF

Absolute interferometry with a 670-nm external cavity diode laser

Appl. Opt. 38(28), 5981-5994 (1999)  View: HTML | PDF

Imaging properties in two-photon excitation microscopy and effects of refractive-index mismatch in thick specimens

Appl. Opt. 38(28), 5995-6003 (1999)  View: HTML | PDF

High-speed, two-photon scanning microscope

Appl. Opt. 38(28), 6004-6009 (1999)  View: HTML | PDF

Design of a diluted aperture by use of the practical cutoff frequency

Appl. Opt. 38(28), 6010-6018 (1999)  View: HTML | PDF

Wave-front generation of Zernike polynomial modes with a micromachined membrane deformable mirror

Appl. Opt. 38(28), 6019-6026 (1999)  View: HTML | PDF

Rayleigh scattering limits for low-level bidirectional reflectance distribution function measurements: corrigendum

Appl. Opt. 38(28), 6027-6028 (1999)  View: HTML | PDF

Dependence of the reflectance of a multilayer reflector on the thickness of the outer layer

Appl. Opt. 38(28), 6034-6035 (1999)  View: HTML | PDF

Sensitivity enhancement of integrated optical sensors by use of thin high-index films

Appl. Opt. 38(28), 6036-6039 (1999)  View: HTML | PDF

n-Hindle-sphere arrangement with an exact ray trace for testing hyperboloid convex mirrors

Appl. Opt. 38(28), 6050-6054 (1999)  View: HTML | PDF

Effect of telescope alignment on a stellar interferometer

Appl. Opt. 38(28), 6055-6067 (1999)  View: HTML | PDF

Microinstrument gradient-force optical trap

Appl. Opt. 38(28), 6068-6074 (1999)  View: HTML | PDF

Hybrid Monte Carlo for photon transport through optically thick scattering media

Appl. Opt. 38(28), 6075-6086 (1999)  View: HTML | PDF

Investigation of the laserlike behavior of polymeric scattering gain media under subpicosecond laser excitation

Appl. Opt. 38(28), 6087-6092 (1999)  View: HTML | PDF