OSA Publishing

1 August 1998, Volume 37, Issue 22, pp. 5051-5347   43 articles

Measure of the influence of detector noise on temperature-measurement accuracy for multiband infrared systems

Appl. Opt. 37(22), 5051-5057 (1998)  View: HTML | PDF

GaN-based solar-ultraviolet detection instrument

Appl. Opt. 37(22), 5058-5062 (1998)  View: HTML | PDF

Variable-spacing diffraction grating employing elastomeric surface waves

Appl. Opt. 37(22), 5063-5069 (1998)  View: HTML | PDF

Narcissistic ghosts in Rowland-mounted, concave gratings with β = 0°: a cautionary note

Appl. Opt. 37(22), 5070-5074 (1998)  View: HTML | PDF

Crossed phase gratings with diffractive optical elements

Appl. Opt. 37(22), 5075-5086 (1998)  View: HTML | PDF

Effects of gap width on vacuum-ultraviolet transmission through submicrometer-period, freestanding transmission gratings

Appl. Opt. 37(22), 5087-5092 (1998)  View: HTML | PDF

Ion-exchanged diffractive elements in glass for substrate-mode optics

Appl. Opt. 37(22), 5093-5098 (1998)  View: HTML | PDF

Coupling characteristics of cladding modes in tilted optical fiber Bragg gratings

Appl. Opt. 37(22), 5099-5105 (1998)  View: HTML | PDF

Analysis of inhomogeneous optical systems by the use of ray tracing. II. Three-dimensional systems with symmetry

Appl. Opt. 37(22), 5106-5111 (1998)  View: HTML | PDF

Ellipsometric scatterometry for the metrology of sub-0.1-μm-linewidth structures

Appl. Opt. 37(22), 5112-5115 (1998)  View: HTML | PDF

Determining the optical constants of read-write sliders during flying-height testing

Appl. Opt. 37(22), 5116-5125 (1998)  View: HTML | PDF

Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement

Appl. Opt. 37(22), 5126-5131 (1998)  View: HTML | PDF

Dispersion in stellar interferometry: simultaneous optimization for delay tracking and visibility measurements

Appl. Opt. 37(22), 5132-5136 (1998)  View: HTML | PDF

Simultaneous measurement of diameter and position of spherical particles in a spray by an original imaging method

Appl. Opt. 37(22), 5137-5144 (1998)  View: HTML | PDF

Spectroellipsometric method for process monitoring semiconductor thin films and interfaces

Appl. Opt. 37(22), 5145-5149 (1998)  View: HTML | PDF

Polarization phase stepping with a Savart element

Appl. Opt. 37(22), 5150-5155 (1998)  View: HTML | PDF

CATRAM: an apparatus for the optical characterization of advanced transparent materials

Appl. Opt. 37(22), 5156-5161 (1998)  View: HTML | PDF

Dual-hologram shearing interferometry with regulated sensitivity

Appl. Opt. 37(22), 5162-5168 (1998)  View: HTML | PDF

Measurement of the complex refractive-index spectrum for birefringent and absorptive liquids

Appl. Opt. 37(22), 5169-5175 (1998)  View: HTML | PDF

Holographic interferometers with photorefractive recording media

Appl. Opt. 37(22), 5176-5183 (1998)  View: HTML | PDF

Phase-aberration correction with dual liquid-crystal spatial light modulators

Appl. Opt. 37(22), 5184-5189 (1998)  View: HTML | PDF

Stability of systems of plane reflecting surfaces

Appl. Opt. 37(22), 5190-5192 (1998)  View: HTML | PDF

Exact design of aplanatic microscope objectives consisting of two conic mirrors

Appl. Opt. 37(22), 5193-5197 (1998)  View: HTML | PDF

Computer numerically controlled plasma chemical vaporization machining with a pipe electrode for optical fabrication

Appl. Opt. 37(22), 5198-5210 (1998)  View: HTML | PDF

Making fast cylindrical gradient-index lenses diffraction limited by using a wave-front-correction element

Appl. Opt. 37(22), 5211-5215 (1998)  View: HTML | PDF

Design and optimization of an irradiance profile-shaping system with a genetic algorithm method

Appl. Opt. 37(22), 5216-5221 (1998)  View: HTML | PDF

Optical acceptance function of modified compound parabolic concentrators with linear corrugated reflectors

Appl. Opt. 37(22), 5222-5226 (1998)  View: HTML | PDF

High-efficiency prism light guides with confocal parabolic cross sections

Appl. Opt. 37(22), 5227-5233 (1998)  View: HTML | PDF

Polarization-based tunable interferometric filter

Appl. Opt. 37(22), 5234-5238 (1998)  View: HTML | PDF

Effect of surface roughness and subsurface damage on grazing-incidence x-ray scattering and specular reflectance

Appl. Opt. 37(22), 5239-5252 (1998)  View: HTML | PDF

High-resolution monochromatic x-ray imaging system based on spherically bent crystals

Appl. Opt. 37(22), 5253-5261 (1998)  View: HTML | PDF

Optical characterization of dielectric and semiconductor thin films by use of transmission data

Appl. Opt. 37(22), 5262-5270 (1998)  View: HTML | PDF

Optical properties of metallic films for vertical-cavity optoelectronic devices

Appl. Opt. 37(22), 5271-5283 (1998)  View: HTML | PDF

Repeatability of the composition of titanium oxide films produced by evaporation of Ti2O3

Appl. Opt. 37(22), 5284-5290 (1998)  View: HTML | PDF

Modeling the index of refraction of insulating solids with a modified lorentz oscillator model

Appl. Opt. 37(22), 5291-5297 (1998)  View: HTML | PDF

Fast characterization of metal films for fiber attenuators

Appl. Opt. 37(22), 5298-5301 (1998)  View: HTML | PDF

Efficient high-energy pulse-train generation using a 2n-pulse michelson interferometer

Appl. Opt. 37(22), 5302-5305 (1998)  View: HTML | PDF

Coherence-based imaging through turbid media by use of degenerate four-wave mixing in thin liquid-crystal films and photorefractives

Appl. Opt. 37(22), 5306-5312 (1998)  View: HTML | PDF

Microscopic imaging through a turbid medium by use of annular objectives for angle gating

Appl. Opt. 37(22), 5320-5326 (1998)  View: HTML | PDF

Two-dimensional near-infrared transillumination imaging of biomedical media with a chromium-doped forsterite laser

Appl. Opt. 37(22), 5327-5336 (1998)  View: HTML | PDF

Absolute emission spectra from Bacillus subtilis and Escherichia coli vegetative cells in solution

Appl. Opt. 37(22), 5344-5347 (1998)  View: HTML | PDF

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