OSA Publishing

1 October 1996, Volume 35, Issue 28, pp. 5465-5739   38 articles

Robust optical coating design with evolutionary strategies

Appl. Opt. 35(28), 5477-5483 (1996)  View: HTML | PDF

Implementation of a numerical needle method for thin-film design

Appl. Opt. 35(28), 5484-5492 (1996)  View: HTML | PDF

Application of the needle optimization technique to the design of optical coatings

Appl. Opt. 35(28), 5493-5508 (1996)  View: HTML | PDF

Coatings with graded-reflectance profile: conventional and unconventional characteristics

Appl. Opt. 35(28), 5509-5519 (1996)  View: HTML | PDF

Two-color imaging by the use of patterned optical filters bonded to focal-plane-array detectors

Appl. Opt. 35(28), 5520-5523 (1996)  View: HTML | PDF

Infrared filters and dichroics for the advanced along-track scanning radiometer

Appl. Opt. 35(28), 5524-5528 (1996)  View: HTML | PDF

Optical coatings for document security

Appl. Opt. 35(28), 5529-5534 (1996)  View: HTML | PDF

Dominant wavelength sensitivity of thin-film color filters to spectral centering

Appl. Opt. 35(28), 5535-5539 (1996)  View: HTML | PDF

Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurements

Appl. Opt. 35(28), 5540-5544 (1996)  View: HTML | PDF

Optical inhomogeneity and microstructure of ZrO2 thin films prepared by ion-assisted deposition

Appl. Opt. 35(28), 5545-5552 (1996)  View: HTML | PDF

Perpendicular-incidence photometric ellipsometry of biaxial anisotropic thin films

Appl. Opt. 35(28), 5553-5556 (1996)  View: HTML | PDF

Anisotropic scatter patterns and anomalous birefringence of obliquely deposited cerium oxide films

Appl. Opt. 35(28), 5563-5568 (1996)  View: HTML | PDF

Modal contours for biaxial thin-film waveguides

Appl. Opt. 35(28), 5569-5572 (1996)  View: HTML | PDF

Low-level scattering and localized defects

Appl. Opt. 35(28), 5573-5582 (1996)  View: HTML | PDF

Multiscale roughness in optical multilayers: atomic force microscopy and light scattering

Appl. Opt. 35(28), 5583-5594 (1996)  View: HTML | PDF

Transmitted scattered light from a thin film with shallow random rough interfaces

Appl. Opt. 35(28), 5595-5599 (1996)  View: HTML | PDF

Ellipsometry of light scattering from multilayer coatings

Appl. Opt. 35(28), 5600-5608 (1996)  View: HTML | PDF

Temperature-stable bandpass filters deposited with plasma ion-assisted deposition

Appl. Opt. 35(28), 5609-5612 (1996)  View: HTML | PDF

Laser conditioning of LaF3/MgF2 dielectric coatings at 248 nm

Appl. Opt. 35(28), 5613-5619 (1996)  View: HTML | PDF

Granularity in ion-beam-sputtered TiO2 films

Appl. Opt. 35(28), 5620-5625 (1996)  View: HTML | PDF

In situ monitoring of film deposition with an ellipsometer based on a four-detector photopolarimeter

Appl. Opt. 35(28), 5626-5629 (1996)  View: HTML | PDF

Frequency selective bolometers

Appl. Opt. 35(28), 5630-5635 (1996)  View: HTML | PDF

Low-power gradient-index microscope objective: design

Appl. Opt. 35(28), 5636-5641 (1996)  View: HTML | PDF

Window function influence on phase error in phase-shifting algorithms

Appl. Opt. 35(28), 5642-5649 (1996)  View: HTML | PDF

Multipass Michelson interferometer with the use of a wavelength-modulated laser diode

Appl. Opt. 35(28), 5650-5656 (1996)  View: HTML | PDF

Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns

Appl. Opt. 35(28), 5657-5666 (1996)  View: HTML | PDF

Optical-fiber vibration sensor using step interferometry

Appl. Opt. 35(28), 5667-5669 (1996)  View: HTML | PDF

Desired concentration-dependent ion exchange for micro-optic lenses

Appl. Opt. 35(28), 5670-5676 (1996)  View: HTML | PDF

Complementary construction of ideal nonimaging concentrators and its applications

Appl. Opt. 35(28), 5677-5682 (1996)  View: HTML | PDF

Measurement of surface temperature and emissivity by a multitemperature method for Fourier-transform infrared spectrometers

Appl. Opt. 35(28), 5683-5691 (1996)  View: HTML | PDF

Optical constants of aluminum films in the extreme ultraviolet interval of 82–77 nm

Appl. Opt. 35(28), 5692-5697 (1996)  View: HTML | PDF

Optical monitoring of silver-based transparent heat mirrors

Appl. Opt. 35(28), 5698-5703 (1996)  View: HTML | PDF

Twyman effect mechanics in grinding and microgrinding

Appl. Opt. 35(28), 5704-5713 (1996)  View: HTML | PDF

Mechanically simple flat-crystal x-ray source/monochromator

Appl. Opt. 35(28), 5714-5721 (1996)  View: HTML | PDF

Reflectometric frequency-modulation continuous-wave distributed fiber-optic stress sensor with forward coupled beams

Appl. Opt. 35(28), 5722-5726 (1996)  View: HTML | PDF

Determination of Teflon thickness with laser speckle. I. Potential for burn depth diagnosis

Appl. Opt. 35(28), 5727-5735 (1996)  View: HTML | PDF

PdSi focal-plane array detectors for short-wave infrared Raman spectroscopy of biological tissue: a feasibility study

Appl. Opt. 35(28), 5736-5739 (1996)  View: HTML | PDF

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