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OSA Publishing

1 August 1995, Volume 34, Issue 22, pp. 4623-5015   53 articles

Prism for in-line beam expansion in one dimension

Appl. Opt. 34(22), 4634-4636 (1995)  View: HTML | PDF

Measurements of the photocurrent enhancement of reverse-biased silicon photodiodes in the 0.05–1.5-keV photon-energy range

Appl. Opt. 34(22), 4637-4639 (1995)  View: HTML | PDF

Vacuum-ultraviolet quantum efficiency of a thinned, backside-illuminated charge-coupled device

Appl. Opt. 34(22), 4640-4650 (1995)  View: HTML | PDF

Modal analysis of transport processes in SPRITE detectors

Appl. Opt. 34(22), 4651-4661 (1995)  View: HTML | PDF

Large-area avalanche photodiodes for the detection of soft x rays

Appl. Opt. 34(22), 4662-4668 (1995)  View: HTML | PDF

Gradient-index contact lens

Appl. Opt. 34(22), 4669-4673 (1995)  View: HTML | PDF

Frequency and phase swept holograms in spectral hole-burning materials

Appl. Opt. 34(22), 4674-4684 (1995)  View: HTML | PDF

First-generation holographic, grazing-incidence gratings for use in converging, extreme-ultraviolet light beams

Appl. Opt. 34(22), 4685-4696 (1995)  View: HTML | PDF

Three-dimensional display system based on a holographic screen and microcomputer-driven galvanometers

Appl. Opt. 34(22), 4697-4699 (1995)  View: HTML | PDF

Artistic effect and application of moiré patterns in security holograms

Appl. Opt. 34(22), 4700-4702 (1995)  View: HTML | PDF

Spatial and spectral response of a Fabry–Perot interferometer illuminated by a Gaussian beam

Appl. Opt. 34(22), 4703-4712 (1995)  View: HTML | PDF

Hybrid optical–digital method for local-displacement analysis by use of a phase-space representation

Appl. Opt. 34(22), 4713-4716 (1995)  View: HTML | PDF

Dispersion-free, multiple-beam interferometer

Appl. Opt. 34(22), 4717-4722 (1995)  View: HTML | PDF

Effect of numerical aperture on interference fringe spacing

Appl. Opt. 34(22), 4731-4734 (1995)  View: HTML | PDF

Low-coherence interferometric sensor system utilizing an integrated optics configuration

Appl. Opt. 34(22), 4735-4739 (1995)  View: HTML | PDF

Two-wavelength laser-diode interferometer with fractional fringe techniques

Appl. Opt. 34(22), 4740-4746 (1995)  View: HTML | PDF

Surface-relief phase structures generated by light-initiated polymerization

Appl. Opt. 34(22), 4747-4754 (1995)  View: HTML | PDF

Optical element converting linear polarization into circular-tangential polarization

Appl. Opt. 34(22), 4768-4771 (1995)  View: HTML | PDF

Statistics of the normalized Stokes parameters for a Gaussian stochastic plane wave field

Appl. Opt. 34(22), 4788-4793 (1995)  View: HTML | PDF

Technique for mapping the spectral uniformity of luminescent semiconducting material

Appl. Opt. 34(22), 4794-4799 (1995)  View: HTML | PDF

Emissivity measurements of reflective surfaces at near-millimeter wavelengths

Appl. Opt. 34(22), 4812-4816 (1995)  View: HTML | PDF

Computed-tomography imaging spectrometer: experimental calibration and reconstruction results

Appl. Opt. 34(22), 4817-4826 (1995)  View: HTML | PDF

Autocollimator for spectroscopy of broad resonances with pulsed lasers

Appl. Opt. 34(22), 4827-4834 (1995)  View: HTML | PDF

Starting designs for the computer optimization of optical coatings

Appl. Opt. 34(22), 4835-4843 (1995)  View: HTML | PDF

Characterization of the Advanced Satellite for Cosmology and Astrophysics x-ray telescope: preflight calibration and ray tracing

Appl. Opt. 34(22), 4848-4856 (1995)  View: HTML | PDF

Scanning heterodyne confocal differential phase and intensity microscope

Appl. Opt. 34(22), 4857-4868 (1995)  View: HTML | PDF

Probe–sample interactions in reflection near-field scanning optical microscopy

Appl. Opt. 34(22), 4869-4876 (1995)  View: HTML | PDF

Fringe-scanning method using a general function for shadow moiré

Appl. Opt. 34(22), 4877-4882 (1995)  View: HTML | PDF

Light diffraction from rough gratings

Appl. Opt. 34(22), 4883-4891 (1995)  View: HTML | PDF

Far-ultraviolet reflectance measurements and optical constants of unoxidized aluminum films

Appl. Opt. 34(22), 4892-4899 (1995)  View: HTML | PDF

Optic systems with spherical, cylindrical, and toric surfaces

Appl. Opt. 34(22), 4900-4906 (1995)  View: HTML | PDF

Beam-fanning novelty filter with enhanced dynamic phase resolution

Appl. Opt. 34(22), 4907-4911 (1995)  View: HTML | PDF

Optical radiation hazards analysis of ultraviolet headlamps

Appl. Opt. 34(22), 4912-4922 (1995)  View: HTML | PDF

Required optical characteristics of materials for phase-shifting masks

Appl. Opt. 34(22), 4923-4928 (1995)  View: HTML | PDF

Effect of surface plasmon excitations on the irradiance pattern of the return beam in optical disk data storage

Appl. Opt. 34(22), 4929-4936 (1995)  View: HTML | PDF

Modulation transfer function evaluation of linear solid-state x-ray-sensitive detectors using edge techniques

Appl. Opt. 34(22), 4937-4943 (1995)  View: HTML | PDF

Partially coherent image formation with x-ray microscopes

Appl. Opt. 34(22), 4944-4950 (1995)  View: HTML | PDF

Phase-retrieval analysis of pre- and post-repair Hubble Space Telescope images

Appl. Opt. 34(22), 4951-4964 (1995)  View: HTML | PDF

Write-once optical disk system measuring 300 mm using high-density, pit-edge recording

Appl. Opt. 34(22), 4965-4971 (1995)  View: HTML | PDF

Phase contrast using photorefractive LiNbO3:Fe crystals

Appl. Opt. 34(22), 4972-4975 (1995)  View: HTML | PDF

Angle measurement based on the internal-reflection effect and the use of right-angle prisms

Appl. Opt. 34(22), 4976-4981 (1995)  View: HTML | PDF

Room-temperature tests of an optical transducer for resonant gravitational wave detectors

Appl. Opt. 34(22), 4982-4988 (1995)  View: HTML | PDF

Moldable optical element: a new tool to obtain the infrared attenuated-total-reflection spectrum of a rough surface

Appl. Opt. 34(22), 4989-4992 (1995)  View: HTML | PDF

Elastic transducers incorporating finite-length optical paths

Appl. Opt. 34(22), 4993-5002 (1995)  View: HTML | PDF

Bragg intragrating structural sensing

Appl. Opt. 34(22), 5003-5009 (1995)  View: HTML | PDF

Vesicle sizing by static light scattering: a Fourier cosine transform approach

Appl. Opt. 34(22), 5010-5015 (1995)  View: HTML | PDF

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