1 July 1994, Volume 33, Issue 19, pp. 4103-4322  
35 articles

Sub-Nyquist null aspheric testing using a computer-stored compensator

Appl. Opt. 33(19), 4103-4108 (1994)  View: HTML | PDF

Analysis of light scattering from a cutting tool edge

Appl. Opt. 33(19), 4113-4119 (1994)  View: HTML | PDF

Hartmann test modification for measuring ophthalmic progressive lenses

Appl. Opt. 33(19), 4120-4124 (1994)  View: HTML | PDF

Scatter rings in bismuth silicate illuminated by a single beam

Appl. Opt. 33(19), 4125-4127 (1994)  View: HTML | PDF

Subdiffraction-limited focusing lens

Appl. Opt. 33(19), 4128-4131 (1994)  View: HTML | PDF

Focused-image holography as a dense-spray diagnostic

Appl. Opt. 33(19), 4132-4136 (1994)  View: HTML | PDF

Real-time displacement measurement using a multicamera phase-stepping speckle interferometer

Appl. Opt. 33(19), 4137-4142 (1994)  View: HTML | PDF

Validation of interferometric imaging from a pupil-masking experiment on a solar telescope

Appl. Opt. 33(19), 4143-4146 (1994)  View: HTML | PDF

Phase-measuring interferometry: new methods and error analysis

Appl. Opt. 33(19), 4147-4155 (1994)  View: HTML | PDF

Aberration compensation in a grating interferometer

Appl. Opt. 33(19), 4156-4163 (1994)  View: HTML | PDF

Errors in film refractive-index determinations from interference fringes

Appl. Opt. 33(19), 4164-4166 (1994)  View: HTML | PDF

Interpretation of fringes obtained with coherent gradient sensing

Appl. Opt. 33(19), 4167-4170 (1994)  View: HTML | PDF

Aspheric mirror with constant angular magnification II

Appl. Opt. 33(19), 4179-4183 (1994)  View: HTML | PDF

Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter: a study of depolarization effects

Appl. Opt. 33(19), 4184-4192 (1994)  View: HTML | PDF

Ultraviolet and visible imaging and spectrographic imaging instrument

Appl. Opt. 33(19), 4201-4213 (1994)  View: HTML | PDF

Broadband extreme-ultraviolet survey spectrometer for short-time-scale experiments

Appl. Opt. 33(19), 4214-4218 (1994)  View: HTML | PDF

Thermal stability of sputtered Mo/X and W/X (X = BN:O, B4C:O, Si, and C) multiplayer soft-x-ray mirrors

Appl. Opt. 33(19), 4219-4224 (1994)  View: HTML | PDF

Normal-incidence reflectance of crystalline K6C60, Rb6C60, and Cs6C60

Appl. Opt. 33(19), 4225-4229 (1994)  View: HTML | PDF

Metal phosphate planar waveguides for biosensors

Appl. Opt. 33(19), 4230-4240 (1994)  View: HTML | PDF

Particle image velocimetry: image labeling by use of adaptive optics to modify the point-spread function

Appl. Opt. 33(19), 4241-4247 (1994)  View: HTML | PDF

Subsurface damage identification in optically transparent materials using a nondestructive method

Appl. Opt. 33(19), 4248-4253 (1994)  View: HTML | PDF

Two-dimensional polarimeter with a charge-coupled-device image sensor and a piezoelastic modulator

Appl. Opt. 33(19), 4254-4260 (1994)  View: HTML | PDF

Graded-index polymer optical fiber for high-speed data communication

Appl. Opt. 33(19), 4261-4266 (1994)  View: HTML | PDF

Skin hydration state estimation using a fiber-optic refractometer

Appl. Opt. 33(19), 4267-4272 (1994)  View: HTML | PDF

Scattered-light properties of diffraction gratings

Appl. Opt. 33(19), 4273-4285 (1994)  View: HTML | PDF

Hyper-Rayleigh light scattering from an aqueous suspension of purple membrane

Appl. Opt. 33(19), 4286-4292 (1994)  View: HTML | PDF

Beam modes in graded-index media and topological phases

Appl. Opt. 33(19), 4293-4299 (1994)  View: HTML | PDF

Effect of antireflection coating on the performance of Faraday rotators

Appl. Opt. 33(19), 4300-4303 (1994)  View: HTML | PDF

Surface and bulk absorption characteristics of chemically vapor-deposited zinc selenide in the infrared

Appl. Opt. 33(19), 4304-4313 (1994)  View: HTML | PDF

Absorption-coefficient-determination method for particulate materials

Appl. Opt. 33(19), 4314-4319 (1994)  View: HTML | PDF

Compact reflection-grating-based phase conjugator in KNbO3:Fe crystals

Appl. Opt. 33(19), 4320-4322 (1994)  View: HTML | PDF