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OSA Publishing

1 March 1993, Volume 32, Issue 7, pp. 1018-1242   31 articles

Vacuum activated polishing laps produce smooth aspheric surfaces

Appl. Opt. 32(7), 1048-1050 (1993)  View: HTML | PDF

Absolute flatness testing by an extended rotation method using two angles of rotation

Appl. Opt. 32(7), 1055-1059 (1993)  View: HTML | PDF

Profile measurements of cylindrical surfaces

Appl. Opt. 32(7), 1060-1064 (1993)  View: HTML | PDF

Experimental investigation of memory effects in intensified photodiode-array spectrograph detectors

Appl. Opt. 32(7), 1065-1077 (1993)  View: HTML | PDF

Talbot plane patterns: grating images or interference effects?

Appl. Opt. 32(7), 1078-1083 (1993)  View: HTML | PDF

Beam quality changes in Hermite–Gauss mode fields propagating through Gaussian apertures

Appl. Opt. 32(7), 1084-1086 (1993)  View: HTML | PDF

Fabry–Perot wavemeter for shot-by-shot analysis of pulsed lasers

Appl. Opt. 32(7), 1095-1099 (1993)  View: HTML | PDF

Partially multiplexing sensor network exploiting low coherence interferometry

Appl. Opt. 32(7), 1100-1103 (1993)  View: HTML | PDF

Flattening the field of postobjective scanners by optimum choice and positioning of polygons

Appl. Opt. 32(7), 1104-1108 (1993)  View: HTML | PDF

Talbot array illuminator with multilevel phase gratings

Appl. Opt. 32(7), 1109-1114 (1993)  View: HTML | PDF

Diffuse reflectance from turbid media: an analytical model of photon migration

Appl. Opt. 32(7), 1115-1121 (1993)  View: HTML | PDF

Theoretical dependence of infrared absorption in bulk-doped silicon on carrier concentration

Appl. Opt. 32(7), 1122-1125 (1993)  View: HTML | PDF

Resonance diffraction efficiency enhancement in sliced multilayers

Appl. Opt. 32(7), 1130-1135 (1993)  View: HTML | PDF

Deposition and characterization of far-infrared absorbing gold black films

Appl. Opt. 32(7), 1136-1144 (1993)  View: HTML | PDF

Graded-reflectance mirrors for beam quality control in laser resonators

Appl. Opt. 32(7), 1145-1153 (1993)  View: HTML | PDF

Antireflection structured surfaces for the infrared spectral region

Appl. Opt. 32(7), 1154-1167 (1993)  View: HTML | PDF

Determination of the optical constants (n, k) of thin dielectric films

Appl. Opt. 32(7), 1168-1172 (1993)  View: HTML | PDF

Determination of the refractive index of a-Si1−xCx:H thin films from infrared absorption spectra

Appl. Opt. 32(7), 1173-1175 (1993)  View: HTML | PDF

Immersion grating for infrared astronomy

Appl. Opt. 32(7), 1176-1178 (1993)  View: HTML | PDF

Differential equation design of finite-conjugate reflective systems

Appl. Opt. 32(7), 1179-1188 (1993)  View: HTML | PDF

Ross null test for conic mirrors

Appl. Opt. 32(7), 1189-1199 (1993)  View: HTML | PDF

Calibrated real-time control of lesion size based on reflectance images

Appl. Opt. 32(7), 1200-1209 (1993)  View: HTML | PDF

Method for accurate optical alignment using diffraction rings from lenses with spherical aberration

Appl. Opt. 32(7), 1210-1215 (1993)  View: HTML | PDF

Metrology of lithographic features: balanced illumination eliminating diffractive bias

Appl. Opt. 32(7), 1216-1224 (1993)  View: HTML | PDF

Fiber sensor for the simultaneous measurement of current and voltage in a high-voltage system

Appl. Opt. 32(7), 1225-1228 (1993)  View: HTML | PDF

Detection of x rays with a fiber-optic interferometric sensor

Appl. Opt. 32(7), 1229-1233 (1993)  View: HTML | PDF

Comparison of methods for generation of absolute reflectance-factor values for bidirectional reflectance-distribution function studies

Appl. Opt. 32(7), 1234-1242 (1993)  View: HTML | PDF

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