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OSA Publishing

1 October 1993, Volume 32, Issue 28, pp. 5397-5691   41 articles

Feature issue on optical interference coatings

Appl. Opt. 32(28), 5415-5415 (1993)  View: HTML | PDF

Some theoretical aspects of thin-film optics and their applications

Appl. Opt. 32(28), 5417-5426 (1993)  View: HTML | PDF

Rugate filter theory: an overview

Appl. Opt. 32(28), 5427-5442 (1993)  View: HTML | PDF

Simulation of thin-film growth

Appl. Opt. 32(28), 5443-5446 (1993)  View: HTML | PDF

Predicting achievable design performance of broadband antireflection coatings

Appl. Opt. 32(28), 5447-5451 (1993)  View: HTML | PDF

Laser mirrors with variable reflected intensity and uniform phase shift: design process

Appl. Opt. 32(28), 5454-5461 (1993)  View: HTML | PDF

Multiwavelength (0.45–10.6 μm) angle-resolved scatterometer or how to extend the optical window

Appl. Opt. 32(28), 5462-5474 (1993)  View: HTML | PDF

Relation between light scattering and the microstructure of optical thin films

Appl. Opt. 32(28), 5475-5480 (1993)  View: HTML | PDF

From light scattering to the microstructure of thin-film multilayers

Appl. Opt. 32(28), 5481-5491 (1993)  View: HTML | PDF

Comparison of surface and bulk scattering in optical multilayers

Appl. Opt. 32(28), 5492-5503 (1993)  View: HTML | PDF

Direct observation of waveguided scattered light in multilayer dielectric thin films

Appl. Opt. 32(28), 5504-5510 (1993)  View: HTML | PDF

Optical scatter characteristics of high-reflectance dielectric coatings and fused-silica substrates

Appl. Opt. 32(28), 5511-5518 (1993)  View: HTML | PDF

Recent progress of optical thin films in the automobile industry

Appl. Opt. 32(28), 5519-5530 (1993)  View: HTML | PDF

Reststrahlen material bilayers: an option for tailoring in the infrared

Appl. Opt. 32(28), 5531-5534 (1993)  View: HTML | PDF

Making aspherical mirrors by thin-film deposition

Appl. Opt. 32(28), 5535-5540 (1993)  View: HTML | PDF

Single-mode couplers through end coatings on optical fibers

Appl. Opt. 32(28), 5541-5548 (1993)  View: HTML | PDF

Mirror quality and efficiency improvements of reflective spatial light modulators by the use of dielectric coatings and chemical-mechanical polishing

Appl. Opt. 32(28), 5549-5556 (1993)  View: HTML | PDF

Optimized design of an antireflection coating for textured silicon solar cells

Appl. Opt. 32(28), 5557-5560 (1993)  View: HTML | PDF

Reactive evaporation of low-defect density hafnia

Appl. Opt. 32(28), 5567-5574 (1993)  View: HTML | PDF

Effect of an electric field on the growth of aluminum film

Appl. Opt. 32(28), 5575-5578 (1993)  View: HTML | PDF

Problems of controlling the optical thickness of infrared coatings during deposition

Appl. Opt. 32(28), 5579-5582 (1993)  View: HTML | PDF

Optical coatings deposited by reactive ion plating

Appl. Opt. 32(28), 5583-5593 (1993)  View: HTML | PDF

Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating

Appl. Opt. 32(28), 5594-5600 (1993)  View: HTML | PDF

Optical properties and environmental stability of oxide coatings deposited by reactive sputtering

Appl. Opt. 32(28), 5601-5605 (1993)  View: HTML | PDF

Emission spectroscopy of reactive low-voltage ion plating for metal-oxide thin films

Appl. Opt. 32(28), 5606-5611 (1993)  View: HTML | PDF

Synthesis and research of the optimum conditions for the optical monitoring of non-quarter-wave multilayers

Appl. Opt. 32(28), 5612-5618 (1993)  View: HTML | PDF

Improved method for determining the optical constants of thin films and its application to molecular-beam-deposited polycrystalline layers

Appl. Opt. 32(28), 5619-5627 (1993)  View: HTML | PDF

Characterization by guided wave of instabilities of optical coatings submitted to high-power flux: thermal and third-order nonlinear properties of dielectric thin films

Appl. Opt. 32(28), 5628-5639 (1993)  View: HTML | PDF

Optical waveguide characterization of dielectric films deposited by reactive low-voltage ion plating

Appl. Opt. 32(28), 5640-5644 (1993)  View: HTML | PDF

Anisotropy in thin films: modeling and measurement of guided and nonguided optical properties: application to TiO2 films

Appl. Opt. 32(28), 5649-5659 (1993)  View: HTML | PDF

Absorption and thermal conductivity of oxide thin films measured by photothermal displacement and reflectance methods

Appl. Opt. 32(28), 5660-5665 (1993)  View: HTML | PDF

Effects of vacuum exposure on stress and spectral shift of high reflective coatings

Appl. Opt. 32(28), 5666-5672 (1993)  View: HTML | PDF

Thin-film optical coating filter stability under different environmental conditions

Appl. Opt. 32(28), 5673-5676 (1993)  View: HTML | PDF

Method for calculating optical coating stabilities

Appl. Opt. 32(28), 5677-5682 (1993)  View: HTML | PDF

Least-squares estimators for the center and radius of circular patterns

Appl. Opt. 32(28), 5683-5685 (1993)  View: HTML | PDF

White-light directional false color coding in discrete imagery

Appl. Opt. 32(28), 5686-5688 (1993)  View: HTML | PDF

Measurement of the numerical aperture and f-number of a lens system by using a phase grating

Appl. Opt. 32(28), 5689-5691 (1993)  View: HTML | PDF

Noise limitations in solid state photodetectors: comment

Appl. Opt. 32(28), 5692-5692 (1993)  View: HTML | PDF

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