1 December 1992, Volume 31, Issue 34, pp. 7147-7374  
33 articles

Examination of the polished surface character of fused silica

Appl. Opt. 31(34), 7164-7173 (1992)  View: HTML | PDF

Surface normal rotation: a new technique for grazing-incidence monochromators

Appl. Opt. 31(34), 7174-7178 (1992)  View: HTML | PDF

Thermal apparent-strain sensitivity of surface-adhered, fiber-optic strain gauges

Appl. Opt. 31(34), 7178-7179 (1992)  View: HTML | PDF

Reset-free system for real-time polarization control and synthesis

Appl. Opt. 31(34), 7180-7182 (1992)  View: HTML | PDF

Measurement of Mueller matrices: erratum

Appl. Opt. 31(34), 7182-7182 (1992)  View: HTML | PDF

Calculation of the effective index for nonguiding regions

Appl. Opt. 31(34), 7183-7190 (1992)  View: HTML | PDF

Optical metrology for two large highly aspheric telescope mirrors

Appl. Opt. 31(34), 7191-7197 (1992)  View: HTML | PDF

Modulation transfer function measurement technique for small-pixel detectors

Appl. Opt. 31(34), 7198-7213 (1992)  View: HTML | PDF

Bolometric detectors: optimization for differential radiometers

Appl. Opt. 31(34), 7214-7218 (1992)  View: HTML | PDF

Characterization of an absolute cryogenic radiometer as a standard detector for radiant-power measurements

Appl. Opt. 31(34), 7219-7225 (1992)  View: HTML | PDF

International intercomparison of detector responsivity at 1300 and 1550 nm

Appl. Opt. 31(34), 7226-7231 (1992)  View: HTML | PDF

Loss mechanisms in optical light pipes

Appl. Opt. 31(34), 7232-7241 (1992)  View: HTML | PDF

Differential type of phase-locked laser diode interferometer free from external disturbance

Appl. Opt. 31(34), 7242-7248 (1992)  View: HTML | PDF

Determination of refractive properties of fluids for dual-wavelength interferometry

Appl. Opt. 31(34), 7249-7252 (1992)  View: HTML | PDF

Direct readout of dynamic phase changes in a fiber-optic homodyne interferometer

Appl. Opt. 31(34), 7253-7258 (1992)  View: HTML | PDF

Scalable aspheric corrective mirror for end-pumped solid-state lasers

Appl. Opt. 31(34), 7259-7266 (1992)  View: HTML | PDF

Shared aperture for two beams of different wavelength using reflective phase gratings and the Talbot effect

Appl. Opt. 31(34), 7267-7276 (1992)  View: HTML | PDF

Methods of choosing sample rays in ray-tracing computations

Appl. Opt. 31(34), 7277-7282 (1992)  View: HTML | PDF

Aligning lithography on opposite surfaces of a substrate

Appl. Opt. 31(34), 7292-7294 (1992)  View: HTML | PDF

Dual-sided lithography: a method for evaluating alignment accuracy

Appl. Opt. 31(34), 7295-7300 (1992)  View: HTML | PDF

Full-field vibrometry using a Fabry–Perot étalon interferometer

Appl. Opt. 31(34), 7301-7308 (1992)  View: HTML | PDF

Optical properties of glasses in the ZnO–CdO–SiO2 ternary system

Appl. Opt. 31(34), 7309-7312 (1992)  View: HTML | PDF

Optical constants of polyimide films in the soft x-ray region from reflection and transmission measurements

Appl. Opt. 31(34), 7313-7327 (1992)  View: HTML | PDF

General ray-tracing formulas for crystal

Appl. Opt. 31(34), 7328-7331 (1992)  View: HTML | PDF

Nonimaging compound parabolic concentrator-type reflectors with variable extreme direction

Appl. Opt. 31(34), 7332-7338 (1992)  View: HTML | PDF

X-ray focusing using microchannel plates

Appl. Opt. 31(34), 7339-7343 (1992)  View: HTML | PDF

Differential optical microscopy based on higher-order Gaussian–Hermite beam patterns

Appl. Opt. 31(34), 7344-7347 (1992)  View: HTML | PDF

Projection moiré fringe pattern prediction using the optical transfer function in the presence of aberrations

Appl. Opt. 31(34), 7348-7354 (1992)  View: HTML | PDF

Applications of optical logic-operated moiré in moiré topography and deflectometry

Appl. Opt. 31(34), 7355-7360 (1992)  View: HTML | PDF

Optical fiber sensing with a low-finesse Fabry–Perot cavity

Appl. Opt. 31(34), 7361-7366 (1992)  View: HTML | PDF

Optical constants of thin silicon films near the silicon L2,3 absorption edge

Appl. Opt. 31(34), 7367-7370 (1992)  View: HTML | PDF

Fringe pattern in holographic interferometry for thermal expansion characterization of anisotropic bodies

Appl. Opt. 31(34), 7371-7374 (1992)  View: HTML | PDF