1 December 1991, Volume 30, Issue 34, pp. 4993-5093  
20 articles

To uphold the highest standards of integrity

Appl. Opt. 30(34), 5005-5007 (1991)  View: HTML | PDF

Anamorphic prism: a new type

Appl. Opt. 30(34), 5008-5009 (1991)  View: HTML | PDF

Differential adaptive optics for astronomical interferometry

Appl. Opt. 30(34), 5010-5011 (1991)  View: HTML | PDF

Ultraviolet photoresponse characteristics of diamond diodes

Appl. Opt. 30(34), 5011-5013 (1991)  View: HTML | PDF

Transmission filter for the compensation of the intensity falloff in the image plane by using opaque dots

Appl. Opt. 30(34), 5014-5015 (1991)  View: HTML | PDF

Infrared optical characteristics of type 2A diamonds

Appl. Opt. 30(34), 5015-5017 (1991)  View: HTML | PDF

Relation between three mode-field-radius definitions: Wrms, WL, and WG

Appl. Opt. 30(34), 5017-5018 (1991)  View: HTML | PDF

Performance of a wideband soft x-ray polarizer

Appl. Opt. 30(34), 5018-5020 (1991)  View: HTML | PDF

Imaging performance analysis of adaptive optical telescopes using laser guide stars

Appl. Opt. 30(34), 5021-5030 (1991)  View: HTML | PDF

Properties of fiber optics for application in astronomical interferometry

Appl. Opt. 30(34), 5031-5036 (1991)  View: HTML | PDF

Design and evaluation of laser sources with high-quality wave fronts

Appl. Opt. 30(34), 5037-5048 (1991)  View: HTML | PDF

Electro-optic variable focal-length lens using PLZT ceramic

Appl. Opt. 30(34), 5049-5055 (1991)  View: HTML | PDF

Spatial resolution of images reconstructed from a bulk-detection scanning-laser microscope

Appl. Opt. 30(34), 5056-5062 (1991)  View: HTML | PDF

Miniaturized fiber-optic Michelson-type interferometric sensors

Appl. Opt. 30(34), 5063-5067 (1991)  View: HTML | PDF

Coherence sensing of time-addressed optical-fiber sensors illuminated by a multimode laser diode

Appl. Opt. 30(34), 5068-5076 (1991)  View: HTML | PDF

Transmission and damage-threshold measurements in AgGaSe2 at 2.1 μm

Appl. Opt. 30(34), 5077-5080 (1991)  View: HTML | PDF

Simple radiometric method for measuring the thermal broadband emissivity of material samples

Appl. Opt. 30(34), 5086-5089 (1991)  View: HTML | PDF

Phase-conjugate interferometric analysis of thin films

Appl. Opt. 30(34), 5090-5093 (1991)  View: HTML | PDF