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OSA Publishing

1 September 1991, Volume 30, Issue 25, pp. 3545-3677   21 articles

High-finesse measurements at low temperatures

Appl. Opt. 30(25), 3560-3561 (1991)  View: HTML | PDF

Arm-length measurement of an interferometer using the optical-frequency-scanning technique

Appl. Opt. 30(25), 3561-3562 (1991)  View: HTML | PDF

Aberration compensation in confocal microscopy

Appl. Opt. 30(25), 3563-3568 (1991)  View: HTML | PDF

Ensquared power for obscured circular pupils with off-center imaging

Appl. Opt. 30(25), 3569-3574 (1991)  View: HTML | PDF

Position offsets in curved-channel microchannel plate detectors

Appl. Opt. 30(25), 3575-3581 (1991)  View: HTML | PDF

Absolute standardless calibration of photodetectors based on quantum two-photon fields

Appl. Opt. 30(25), 3582-3588 (1991)  View: HTML | PDF

Nd:YAG laser machining with multilevel resist kinoforms

Appl. Opt. 30(25), 3604-3606 (1991)  View: HTML | PDF

Use of holographic optical elements in speckle metrology. Part 3: application to fracture mechanics

Appl. Opt. 30(25), 3607-3611 (1991)  View: HTML | PDF

Three-color laser-diode interferometer

Appl. Opt. 30(25), 3612-3616 (1991)  View: HTML | PDF

Double sinusoidal phase-modulating laser diode interferometer for distance measurement

Appl. Opt. 30(25), 3617-3621 (1991)  View: HTML | PDF

Phase-locked laser diode interferometer: high-speed feedback control system

Appl. Opt. 30(25), 3622-3626 (1991)  View: HTML | PDF

Fourier fringe analysis: the two-dimensional phase unwrapping problem

Appl. Opt. 30(25), 3627-3632 (1991)  View: HTML | PDF

Imaging and radiometric properties of microlens arrays

Appl. Opt. 30(25), 3633-3642 (1991)  View: HTML | PDF

Analysis of miniature FLIR test targets

Appl. Opt. 30(25), 3650-3655 (1991)  View: HTML | PDF

Interferometric method for concurrent measurement of thermo-optic and thermal expansion coefficients

Appl. Opt. 30(25), 3656-3660 (1991)  View: HTML | PDF

Optical properties of sol-gel spin-coated TiO2 films and comparison of the properties with ion-beam-sputtered films

Appl. Opt. 30(25), 3661-3666 (1991)  View: HTML | PDF

Electron micrography and x-ray study of dip-lacquered LiF (220)

Appl. Opt. 30(25), 3667-3672 (1991)  View: HTML | PDF

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