OSA Publishing

1 August 1991, Volume 30, Issue 22, pp. 3072-3262   29 articles

Formula for the future

Appl. Opt. 30(22), 3082-3086 (1991)  View: HTML | PDF

Delayed elastic effects in the glass ceramics Zerodur and ULE at room temperature

Appl. Opt. 30(22), 3087-3088 (1991)  View: HTML | PDF

Fourteen-decade photocurrent measurements with large-area silicon photodiodes at room temperature

Appl. Opt. 30(22), 3091-3099 (1991)  View: HTML | PDF

Multiplex Fabry–Perot interferometer

Appl. Opt. 30(22), 3108-3113 (1991)  View: HTML | PDF

High-resolution spectrometry with a masked Fabry–Perot interferometer

Appl. Opt. 30(22), 3114-3118 (1991)  View: HTML | PDF

Influence of aberrations of Fizeau interferometer elements on measurement errors

Appl. Opt. 30(22), 3126-3132 (1991)  View: HTML | PDF

Prototype Michelson interferometer with Fabry–Perot cavities

Appl. Opt. 30(22), 3133-3138 (1991)  View: HTML | PDF

Two-wavelength double heterodyne interferometry using a matched grating technique

Appl. Opt. 30(22), 3139-3144 (1991)  View: HTML | PDF

Estimation of optical parameters in a living tissue by solving the inverse problem of the multiflux radiative transfer

Appl. Opt. 30(22), 3145-3153 (1991)  View: HTML | PDF

Procedure for computer-controlled milling of accurate surfaces of revolution for millimeter and far-infrared mirrors

Appl. Opt. 30(22), 3163-3165 (1991)  View: HTML | PDF

Properties of chemical-vapor-deposited silicon carbide for optics applications in severe environments

Appl. Opt. 30(22), 3166-3175 (1991)  View: HTML | PDF

Attenuated-total-reflection technique for the determination of optical constants

Appl. Opt. 30(22), 3176-3180 (1991)  View: HTML | PDF

Absolute measurements of diffuse reflectance in the α°/d configuration

Appl. Opt. 30(22), 3181-3185 (1991)  View: HTML | PDF

Infrared optical constants and roughness factor functions determination: the HTHRTR method

Appl. Opt. 30(22), 3186-3196 (1991)  View: HTML | PDF

Measurement of angular velocity using speckle photography

Appl. Opt. 30(22), 3197-3199 (1991)  View: HTML | PDF

Profile measurement of an aspheric cylindrical surface from retroreflection

Appl. Opt. 30(22), 3200-3204 (1991)  View: HTML | PDF

Profile measuring method based on reflection characteristics at a critical angle in a right-angle prism

Appl. Opt. 30(22), 3205-3209 (1991)  View: HTML | PDF

Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry

Appl. Opt. 30(22), 3210-3220 (1991)  View: HTML | PDF

Light-scattering measurement of the rms slopes of rough surfaces

Appl. Opt. 30(22), 3221-3227 (1991)  View: HTML | PDF

Optical methods for thickness measurements on thin metal films

Appl. Opt. 30(22), 3228-3232 (1991)  View: HTML | PDF

TiO2–SiO2 mixed films prepared by the fast alternating sputter method

Appl. Opt. 30(22), 3233-3237 (1991)  View: HTML | PDF

Adaptation of the refractive indices of antireflection coatings to other surrounding media

Appl. Opt. 30(22), 3238-3241 (1991)  View: HTML | PDF

Sidelobe suppression of the point–spread function in annular-pupil optical systems

Appl. Opt. 30(22), 3242-3245 (1991)  View: HTML | PDF

Direct imaging of nonsolar planets with infrared telescopes using apodized coronagraphs

Appl. Opt. 30(22), 3253-3262 (1991)  View: HTML | PDF

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