OSA Publishing

1 May 1991, Volume 30, Issue 13, pp. 1567-1759   35 articles

Inadequate heating of fused silica components during the coating process

Appl. Opt. 30(13), 1578-1579 (1991)  View: HTML | PDF

Possibilities for projection x-ray lithography using holographic optical elements

Appl. Opt. 30(13), 1580-1582 (1991)  View: HTML | PDF

Temperature dependence of optical constants of MoS2 for pyrooptical devices

Appl. Opt. 30(13), 1583-1584 (1991)  View: HTML | PDF

ABCD matrix for weakly apertured Gaussian beams in the far field

Appl. Opt. 30(13), 1584-1585 (1991)  View: HTML | PDF

ABCD matrix for apertured spherical waves

Appl. Opt. 30(13), 1585-1586 (1991)  View: HTML | PDF

Two-dimensional reflection imaging scanner isolates illumination and collection paths

Appl. Opt. 30(13), 1586-1588 (1991)  View: HTML | PDF

Annulling parasitic fringes in real time holographic interferometry: a new method

Appl. Opt. 30(13), 1588-1590 (1991)  View: HTML | PDF

Diffraction field of a circularly symmetric beam through a sequence of apertures

Appl. Opt. 30(13), 1595-1597 (1991)  View: HTML | PDF

Real-time holographic phase organization technique to obtain customized contouring of diffuse surfaces

Appl. Opt. 30(13), 1603-1610 (1991)  View: HTML | PDF

Factorial optimization of bleach constituents for silver halide holograms

Appl. Opt. 30(13), 1611-1616 (1991)  View: HTML | PDF

Three-illumination-beam phase-shifted holographic interferometry study of thermally induced displacements on a printed wiring board

Appl. Opt. 30(13), 1617-1623 (1991)  View: HTML | PDF

Algorithm for computer tracing of interference fringes

Appl. Opt. 30(13), 1624-1628 (1991)  View: HTML | PDF

Multimode fiber interferometry with and without phase conjugation

Appl. Opt. 30(13), 1629-1632 (1991)  View: HTML | PDF

Three-channel phase stepped system for moire interferometry

Appl. Opt. 30(13), 1633-1635 (1991)  View: HTML | PDF

Image processing algorithms for the analysis of phase-shifted speckle interference patterns

Appl. Opt. 30(13), 1636-1641 (1991)  View: HTML | PDF

Position sensing of a grating mark by heterodyne detection using a Zeeman laser

Appl. Opt. 30(13), 1642-1647 (1991)  View: HTML | PDF

Precision displacement measurement by active laser heterodyne interferometry

Appl. Opt. 30(13), 1648-1652 (1991)  View: HTML | PDF

Possible high absorptance and low emittance selective surface for high temperature solar thermal collectors

Appl. Opt. 30(13), 1653-1658 (1991)  View: HTML | PDF

Modulation transfer function cascade model for a sampled IR imaging system

Appl. Opt. 30(13), 1659-1664 (1991)  View: HTML | PDF

Analytical electrical model for a Si liquid crystal light valve

Appl. Opt. 30(13), 1665-1672 (1991)  View: HTML | PDF

Projection moire fringe pattern prediction using the optical transfer function

Appl. Opt. 30(13), 1673-1677 (1991)  View: HTML | PDF

Automated high precision variable aperture for spectrophotometer linearity testing

Appl. Opt. 30(13), 1678-1687 (1991)  View: HTML | PDF

Possibility of lifetime measurement in a flowing medium with phase fluorometry

Appl. Opt. 30(13), 1688-1694 (1991)  View: HTML | PDF

Rangefinder based on intensity gradient measurement

Appl. Opt. 30(13), 1695-1700 (1991)  View: HTML | PDF

Glass flake reinforced composites as optical materials

Appl. Opt. 30(13), 1701-1710 (1991)  View: HTML | PDF

Measurement of the index of refraction of the plastic Phenoxy PKFE

Appl. Opt. 30(13), 1711-1714 (1991)  View: HTML | PDF

Fiber optic interferometer for testing conic section surfaces

Appl. Opt. 30(13), 1715-1722 (1991)  View: HTML | PDF

Coherency matrix polarization measurements: application to magnetooptic garnet films

Appl. Opt. 30(13), 1730-1734 (1991)  View: HTML | PDF

Optical performance evaluation of a circular cylindrical solar concentrator using different absorber shapes

Appl. Opt. 30(13), 1735-1740 (1991)  View: HTML | PDF

Multilayer reflecting x-ray optical systems: chromatic vignetting by narrow reflection bands

Appl. Opt. 30(13), 1741-1745 (1991)  View: HTML | PDF

Design criteria for band rejection filters made from multilayers of dielectric and ultrathin metal films

Appl. Opt. 30(13), 1746-1748 (1991)  View: HTML | PDF

X-ray optics. 2: A technique for high resolution spectroscopy

Appl. Opt. 30(13), 1749-1759 (1991)  View: HTML | PDF

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