OSA Publishing

15 November 1988, Volume 27, Issue 22, pp. 4595-4790   38 articles

NASA Patter

Appl. Opt. 27(22), 4598-4776 (1988)  View: HTML | PDF

Refractive index measurement of optical windows by an interferometric–deflectometric method

Appl. Opt. 27(22), 4602-4603 (1988)  View: HTML | PDF

Influence of the slopes of the specimen grating surface on out-of-plane displacements measured by moire interferometry

Appl. Opt. 27(22), 4603-4605 (1988)  View: HTML | PDF

Passive tilt compensation in an FTS using a double-sided flat retroreflector

Appl. Opt. 27(22), 4605-4606 (1988)  View: HTML | PDF

High sensitivity atmospheric transmission measurements using a cavity ringdown technique

Appl. Opt. 27(22), 4606-4608 (1988)  View: HTML | PDF

Alternate representation of prism refraction for light incident at the Brewster angle

Appl. Opt. 27(22), 4608-4609 (1988)  View: HTML | PDF

Effect of multiple internal reflections on the stability of electrooptic and magnetooptic sensors

Appl. Opt. 27(22), 4609-4611 (1988)  View: HTML | PDF

Multiline operation of a helical TEA CO2 laser

Appl. Opt. 27(22), 4611-4612 (1988)  View: HTML | PDF

Optical inspection: introduction by the feature editor

Appl. Opt. 27(22), 4613-4614 (1988)  View: HTML | PDF

Books

Appl. Opt. 27(22), 4614-4790 (1988)  View: HTML | PDF

Video high-density disk surface testing with a laser diode and a position sensor

Appl. Opt. 27(22), 4615-4619 (1988)  View: HTML | PDF

Inspection of surface flaws by comparator microscopy

Appl. Opt. 27(22), 4620-4625 (1988)  View: HTML | PDF

Surface inspection via projection interferometry

Appl. Opt. 27(22), 4626-4630 (1988)  View: HTML | PDF

Range sensing by shearing interferometry: influence of speckle

Appl. Opt. 27(22), 4631-4637 (1988)  View: HTML | PDF

Range sensing based on shearing interferometry

Appl. Opt. 27(22), 4638-4644 (1988)  View: HTML | PDF

Optical inspection of industrial materials by unidimensional Fourier transform

Appl. Opt. 27(22), 4645-4652 (1988)  View: HTML | PDF

Industrial use of a real-time optical inspection system

Appl. Opt. 27(22), 4653-4659 (1988)  View: HTML | PDF

Determination of the SiO2/Si interface roughness by diffuse reflectance measurements

Appl. Opt. 27(22), 4660-4663 (1988)  View: HTML | PDF

Dynamic imaging microellipsometry: theory, system design, and feasibility demonstration

Appl. Opt. 27(22), 4664-4671 (1988)  View: HTML | PDF

Heat conductivity of oxide coatings by photothermal radiometry between 293 and 1173 K

Appl. Opt. 27(22), 4672-4675 (1988)  View: HTML | PDF

Use of optical scattering to characterize dislocations in semiconductors

Appl. Opt. 27(22), 4676-4683 (1988)  View: HTML | PDF

Acquisition of 3-D data by focus sensing

Appl. Opt. 27(22), 4684-4689 (1988)  View: HTML | PDF

Ultrasonic noncontact inspection system with optical fiber methods

Appl. Opt. 27(22), 4690-4695 (1988)  View: HTML | PDF

Generation of ultrasound by repetitively Q-switching a pulsed Nd:YAG laser

Appl. Opt. 27(22), 4696-4700 (1988)  View: HTML | PDF

Photothermal lensing spectroscopy in a flowing medium: theory

Appl. Opt. 27(22), 4701-4711 (1988)  View: HTML | PDF

High resolution VUV spectroscopic facility at the SURF II electron storage ring

Appl. Opt. 27(22), 4712-4724 (1988)  View: HTML | PDF

Interferometers: equivalent sine condition

Appl. Opt. 27(22), 4725-4730 (1988)  View: HTML | PDF

Universal digital speckle shearing interferometer

Appl. Opt. 27(22), 4731-4734 (1988)  View: HTML | PDF

Dynamic interferometry using two phase conjugate waves

Appl. Opt. 27(22), 4735-4738 (1988)  View: HTML | PDF

Holographic optical scanning elements with minimum aberrations

Appl. Opt. 27(22), 4739-4746 (1988)  View: HTML | PDF

Recursive design for an efficient HOE with different recording and readout wavelengths

Appl. Opt. 27(22), 4747-4752 (1988)  View: HTML | PDF

Computerized design and generation of space-variant holographic filters: 2: Applications of space-variant filters to optical computing

Appl. Opt. 27(22), 4761-4765 (1988)  View: HTML | PDF

Design of a pipelined optical binary processor

Appl. Opt. 27(22), 4766-4770 (1988)  View: HTML | PDF

Radiometric analysis of infrared sensor performance

Appl. Opt. 27(22), 4771-4776 (1988)  View: HTML | PDF

Point source diffraction and its use in an encoder

Appl. Opt. 27(22), 4777-4781 (1988)  View: HTML | PDF

Aberrations in high aperture conventional and confocal imaging systems

Appl. Opt. 27(22), 4782-4786 (1988)  View: HTML | PDF

Growth of beam perturbations by stimulated light by light scattering in the atmosphere

Appl. Opt. 27(22), 4787-4790 (1988)  View: HTML | PDF

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