OSA Publishing

15 February 1984, Volume 23, Issue 4, pp. 513-640   26 articles

Books

Appl. Opt. 23(4), 518-640 (1984)  View: HTML | PDF

Nonstandard representations of aspheric surfaces in a telescope design

Appl. Opt. 23(4), 520-522 (1984)  View: HTML | PDF

Homodyne receiver for ASK signals at 10-μm wavelength

Appl. Opt. 23(4), 523-524 (1984)  View: HTML | PDF

Experimental determination of the phase in a speckle pattern by temporal modulation of a reference field

Appl. Opt. 23(4), 524-526 (1984)  View: HTML | PDF

Solvent effects in oscillator/amplifier configured dye lasers

Appl. Opt. 23(4), 526-527 (1984)  View: HTML | PDF

Measurements of Doppler shifts by gas correlation spectroscopy

Appl. Opt. 23(4), 527-528 (1984)  View: HTML | PDF

Focus correction for a CRT color facsimile system

Appl. Opt. 23(4), 529-536 (1984)  View: HTML | PDF

Dielectric measurements of optical materials in the 80–500-K range, with a three-terminal capacitance cell

Appl. Opt. 23(4), 537-540 (1984)  View: HTML | PDF

Optical properties of NH3 ice from the far infrared to the near ultraviolet

Appl. Opt. 23(4), 541-547 (1984)  View: HTML | PDF

Far-IR optical properties of Y3Al5O12, LiYF4, Cs2NaDyCl6, and Rb2NaYF6

Appl. Opt. 23(4), 548-551 (1984)  View: HTML | PDF

Ion-assisted deposition of optical thin films: low energy vs high energy bombardment

Appl. Opt. 23(4), 552-559 (1984)  View: HTML | PDF

Feature enhancement of film mammograms using fixed and adaptive neighborhoods

Appl. Opt. 23(4), 560-564 (1984)  View: HTML | PDF

Automatic focus control: the astigmatic lens approach

Appl. Opt. 23(4), 565-570 (1984)  View: HTML | PDF

Gratings for metrology and process control. 1: A simple parameter optimization problem

Appl. Opt. 23(4), 571-575 (1984)  View: HTML | PDF

Gratings for metrology and process control. 2: Thin film thickness measurement

Appl. Opt. 23(4), 576-583 (1984)  View: HTML | PDF

Bolometers: ultimate sensitivity, optimization, and amplifier coupling

Appl. Opt. 23(4), 584-588 (1984)  View: HTML | PDF

Aging properties of Kodak type 101 emulsions

Appl. Opt. 23(4), 589-596 (1984)  View: HTML | PDF

Projects at The Smithsonian Air and Space Museum

Appl. Opt. 23(4), 600-600 (1984)  View: HTML | PDF

Interference phenomena in the refraction of a surface polariton by vertical dielectric barriers

Appl. Opt. 23(4), 607-611 (1984)  View: HTML | PDF

Doppler line profile analysis for a multichannel Fabry-Perot interferometer

Appl. Opt. 23(4), 612-620 (1984)  View: HTML | PDF

Analytical description of an imperfect Fabry-Perot etalon

Appl. Opt. 23(4), 621-627 (1984)  View: HTML | PDF

Interferometric method for checking the mask alignment precision in the lithographic process

Appl. Opt. 23(4), 628-632 (1984)  View: HTML | PDF

Temperature dependence of the Faraday rotation of Hoya FR-5 glass

Appl. Opt. 23(4), 633-636 (1984)  View: HTML | PDF

Techniques for measuring 1-μm diam Gaussian beams

Appl. Opt. 23(4), 637-640 (1984)  View: HTML | PDF

Select as filters


    Select Topics Cancel
    © Copyright 2015 | The Optical Society. All Rights Reserved