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OSA Publishing

15 January 1979, Volume 18, Issue 2, pp. 141-252   23 articles

Continuous frequency scanning of a stabilized single-mode Q-switched Nd3+: glass laser

Appl. Opt. 18(2), 141-142 (1979)  View: HTML | PDF

Laser resonators folded by diffraction gratings: errata

Appl. Opt. 18(2), 142-143 (1979)  View: HTML | PDF

Nearly degenerate four-wave mixing applied to optical filters

Appl. Opt. 18(2), 143-145 (1979)  View: HTML | PDF

Mode conversion in a thin film waveguide by a two-stage coupling process

Appl. Opt. 18(2), 145-146 (1979)  View: HTML | PDF

Books

Appl. Opt. 18(2), 146-148 (1979)  View: HTML | PDF

Optical computation using residue arithmetic

Appl. Opt. 18(2), 149-162 (1979)  View: HTML | PDF

Optical residue arithmetic: a correlation approach

Appl. Opt. 18(2), 163-171 (1979)  View: HTML | PDF

Real-time tracking of moving objects by optical correlation

Appl. Opt. 18(2), 172-174 (1979)  View: HTML | PDF

Measurement of the gain and refraction effects in a solid state laser

Appl. Opt. 18(2), 175-178 (1979)  View: HTML | PDF

Active cavity radiometer type IV

Appl. Opt. 18(2), 179-188 (1979)  View: HTML | PDF

Approximate analytic solutions for the optical pumping of fluorescent dyes

Appl. Opt. 18(2), 189-192 (1979)  View: HTML | PDF

Automatic phase-matched frequency-doubling system for the 240–350-nm region

Appl. Opt. 18(2), 193-196 (1979)  View: HTML | PDF

Threaded article parameter measurement by spatial spectra analysis

Appl. Opt. 18(2), 197-200 (1979)  View: HTML | PDF

Multiwavelength rainbow holographic interferometry

Appl. Opt. 18(2), 212-218 (1979)  View: HTML | PDF

Two-frequency laser interferometer for small displacement measurements in a low frequency range

Appl. Opt. 18(2), 219-224 (1979)  View: HTML | PDF

Absolute distance measurements by CO2 laser multiwavelength interferometry

Appl. Opt. 18(2), 225-227 (1979)  View: HTML | PDF

Exposure time for space-borne ir spatial interferometer

Appl. Opt. 18(2), 228-232 (1979)  View: HTML | PDF

Transient deformation of liquid surfaces by laser-induced thermocapillarity

Appl. Opt. 18(2), 233-235 (1979)  View: HTML | PDF

Assessment of surface roughness by x-ray scattering and differential interference contrast microscopy

Appl. Opt. 18(2), 236-242 (1979)  View: HTML | PDF

Optical remote sensing of atmospheric turbulence: a comparison with simultaneous thermal measurements

Appl. Opt. 18(2), 243-247 (1979)  View: HTML | PDF

Scanning-electron-microscope-written gratings in chalcogenide films for optical integrated circuits

Appl. Opt. 18(2), 248-252 (1979)  View: HTML | PDF

From the Editor

Appl. Opt. 18(2), A15-A16 (1979)  View: HTML | PDF

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