15 February 1978, Volume 17, Issue 4, pp. 491-670  
32 articles

Resonances in the efficiency factors for absorption: Mie scattering theory

Appl. Opt. 17(4), 491-493 (1978)  View: HTML | PDF

Discrete absorptions and emissions in crop spectra

Appl. Opt. 17(4), 493-496 (1978)  View: HTML | PDF

Books

Appl. Opt. 17(4), 496-496 (1978)  View: HTML | PDF

Applied optics curriculum at Georgia Tech

Appl. Opt. 17(4), 501-503 (1978)  View: HTML | PDF

Closed form expression for optical pulse broadening in multiple-scattering media

Appl. Opt. 17(4), 504-505 (1978)  View: HTML | PDF

Additional property of interferometer symmetry

Appl. Opt. 17(4), 505-505 (1978)  View: HTML | PDF

Argon lines from electrodeless mercury-198 lamps

Appl. Opt. 17(4), 506-506 (1978)  View: HTML | PDF

AFGL trace gas compilation

Appl. Opt. 17(4), 507-507 (1978)  View: HTML | PDF

Total internal reflection: a deeper look

Appl. Opt. 17(4), 509-519 (1978)  View: HTML | PDF

Nonlinear reflection properties of germanium associated with thermal effects

Appl. Opt. 17(4), 520-525 (1978)  View: HTML | PDF

Refractive index changes in germanium due to intense radiation

Appl. Opt. 17(4), 526-530 (1978)  View: HTML | PDF

Fast computation method for derivatives of multilayer stack reflectance

Appl. Opt. 17(4), 538-541 (1978)  View: HTML | PDF

Wavelength-scanning polarization-modulation ellipsometry: some practical considerations

Appl. Opt. 17(4), 542-552 (1978)  View: HTML | PDF

Measurement of steep aspheric surfaces

Appl. Opt. 17(4), 553-557 (1978)  View: HTML | PDF

Interferometric testing with computer-generated holograms: aberration balancing method and error analysis

Appl. Opt. 17(4), 558-565 (1978)  View: HTML | PDF

Latent-imaging photopolymer systems

Appl. Opt. 17(4), 566-573 (1978)  View: HTML | PDF

Self-scanned photodiode array: high performance operation in high dispersion astronomical spectrophotometry

Appl. Opt. 17(4), 574-592 (1978)  View: HTML | PDF

Spectral irradiance standard for the ultraviolet: the deuterium lamp

Appl. Opt. 17(4), 593-600 (1978)  View: HTML | PDF

Soft x-ray imaging with toroidal mirrors

Appl. Opt. 17(4), 601-603 (1978)  View: HTML | PDF

Balloon-borne ultraviolet stellar echelle spectrograph

Appl. Opt. 17(4), 604-613 (1978)  View: HTML | PDF

Four-component polarization measurement of lidar atmospheric scattering

Appl. Opt. 17(4), 614-620 (1978)  View: HTML | PDF

Reflectivity of gold coated surfaces in the soft x-ray range

Appl. Opt. 17(4), 621-623 (1978)  View: HTML | PDF

Analysis of differential absorption lidar from the Space Shuttle

Appl. Opt. 17(4), 624-630 (1978)  View: HTML | PDF

Particle size measuring device in real time for dense particulate systems

Appl. Opt. 17(4), 631-634 (1978)  View: HTML | PDF

Exploding PbS film Q-switch laser

Appl. Opt. 17(4), 635-641 (1978)  View: HTML | PDF

Measurement of loss and output numerical aperture of optical fiber splices

Appl. Opt. 17(4), 642-645 (1978)  View: HTML | PDF

Fiber optic sheet formation by selective photopolymerization

Appl. Opt. 17(4), 646-650 (1978)  View: HTML | PDF

Baseband frequency response measurement system for optical components

Appl. Opt. 17(4), 651-654 (1978)  View: HTML | PDF

Multiple-invariant space-variant optical processors

Appl. Opt. 17(4), 655-659 (1978)  View: HTML | PDF

Image restoration by spline functions

Appl. Opt. 17(4), 660-666 (1978)  View: HTML | PDF

Laser Doppler particle measuring system using nonsinusoidal forced vibration and bispectral analysis

Appl. Opt. 17(4), 667-670 (1978)  View: HTML | PDF