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OSA Publishing

20 February 2018, Volume 57, Issue 6, pp. 1284-1523   34 articles


Instrumentation, Measurement, and Metrology

Non-contact XUV metrology of Ru/B4C multilayer optics by means of Hartmann wavefront analysis

Appl. Opt. 57(6), 1315-1320 (2018)  View: HTML | PDF

Editors' Pick

Wide color gamut display with white and emerald backlighting

Appl. Opt. 57(6), 1338-1344 (2018)  View: HTML | PDF

High dynamic range 3D shape measurement based on the intensity response function of a camera

Appl. Opt. 57(6), 1378-1386 (2018)  View: HTML | PDF

Air wedge with variable refractive index for precise laser beam steering in a small range

Appl. Opt. 57(6), 1417-1423 (2018)  View: HTML | PDF

Highly thermal-stable heterodyne interferometer with minimized periodic nonlinearity

Appl. Opt. 57(6), 1463-1467 (2018)  View: HTML | PDF

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