OSA Publishing

1 October 2016, Volume 55, Issue 28, pp. 7763-8137   52 articles

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Instrumentation, Measurement, and Metrology

Chirp evaluation of semiconductor DFB lasers through a simple Interferometry-Based (IB) technique

Appl. Opt. 55(28), 7788-7795 (2016)  View: HTML | PDF

Directional view method for a time-sequential autostereoscopic display with full resolution

Appl. Opt. 55(28), 7847-7854 (2016)  View: HTML | PDF  [Suppl. Mat. (1)]

Ion beam figuring approach for thermally sensitive space optics

Appl. Opt. 55(28), 8049-8055 (2016)  View: HTML | PDF

Exact recovery of wavefront from multishearing interferograms in spatial domain

Appl. Opt. 55(28), 8063-8069 (2016)  View: HTML | PDF

Nonintrusive measurement of the liquid refractive index by using properties of the cuvette wall

Appl. Opt. 55(28), 8101-8106 (2016)  View: HTML | PDF

Instrumentation, Measurement, and Metrology

Generalized phase-shifting algorithms: error analysis and minimization of noise propagation: erratum

Appl. Opt. 55(28), 7763-7763 (2016)  View: HTML | PDF

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