OSA Publishing

1 July 2015, Volume 54, Issue 19, pp. 5882-6139   38 articles

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Instrumentation, Measurement, and Metrology

Calibrating system errors of large scale three-dimensional profile measurement instruments by subaperture stitching method

Appl. Opt. 54(19), 5962-5969 (2015)  View: HTML | PDF

Precision and accuracy testing of FMCW ladar-based length metrology

Appl. Opt. 54(19), 6019-6024 (2015)  View: HTML | PDF

Enhancing the resolution limits of spectral interferometric measurements with swept-wavelength interrogation by means of a reference interferometer

Appl. Opt. 54(19), 6029-6036 (2015)  View: HTML | PDF

Scattering and polarization properties of the scarab beetle Cyphochilus insulanus cuticle

Appl. Opt. 54(19), 6037-6045 (2015)  View: HTML | PDF

Real part of refractive index measurement approach for absorbing liquid

Appl. Opt. 54(19), 6046-6052 (2015)  View: HTML | PDF

Shadow removal method for phase-shifting profilometry

Appl. Opt. 54(19), 6059-6064 (2015)  View: HTML | PDF

Strain field measurement by transverse digital holography

Appl. Opt. 54(19), 6065-6070 (2015)  View: HTML | PDF

Real-time phase error compensation in phase sensitive scanning near-field optical microscopy

Appl. Opt. 54(19), 6128-6133 (2015)  View: HTML | PDF

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