OSA Publishing

1 May 2015, Volume 54, Issue 13, pp. 3817-4308 Feat. pp: D1–D98   81 articles

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Instrumentation, Measurement, and Metrology

Comparative study on passive and active projector nonlinear gamma calibration

Appl. Opt. 54(13), 3834-3841 (2015)  View: HTML | PDF

Aberration calibration in high-NA spherical surfaces measurement on point diffraction interferometry

Appl. Opt. 54(13), 3877-3885 (2015)  View: HTML | PDF

Spectral and total effective emissivity of a nonisothermal blackbody cavity formed by two coaxial tubes

Appl. Opt. 54(13), 3948-3955 (2015)  View: HTML | PDF

Bidirectional reflectance scale comparison between NIST and PTB

Appl. Opt. 54(13), 4006-4015 (2015)  View: HTML | PDF

Practical method study on correcting yaw error of 500  mm grating blank carriage in real time

Appl. Opt. 54(13), 4084-4088 (2015)  View: HTML | PDF

Piston error calibration of zonal reconstruction for a segmented wavefront in lateral shearing interferometry

Appl. Opt. 54(13), 4180-4187 (2015)  View: HTML | PDF

Subnanometer resolution displacement sensor based on a grating interferometric cavity with intensity compensation and phase modulation

Appl. Opt. 54(13), 4188-4196 (2015)  View: HTML | PDF

Surface profile measurement of a highly reflective silicon wafer by phase-shifting interferometry

Appl. Opt. 54(13), 4207-4213 (2015)  View: HTML | PDF

Time-resolved combination of the Mueller–Stokes and Jones calculus for the optimization of a twisted-nematic spatial-light modulator

Appl. Opt. 54(13), 4239-4248 (2015)  View: HTML | PDF

Nanometer level characterization of the James Webb Space Telescope optomechanical systems using high-speed interferometry

Appl. Opt. 54(13), 4285-4298 (2015)  View: HTML | PDF

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