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OSA Publishing

20 January 2017, Volume 56, Issue 3, pp. 365-760; Feat. pp: ARL1–B239   85 articles


Instrumentation, Measurement, and Metrology

Comparative analysis of nanometric inspection methods in fringeless speckle pattern interferometry

Appl. Opt. 56(3), 365-374 (2017)  View: HTML | PDF

Image-based spectral transmission estimation using “sensitivity comparison”

Appl. Opt. 56(3), 417-423 (2017)  View: HTML | PDF

Theoretical algorithm and application of a double-integrating sphere system for measuring leaf transmittance and reflectance spectra

Appl. Opt. 56(3), 563-571 (2017)  View: HTML | PDF

Measurement of straightness without Abbe error using an enhanced differential plane mirror interferometer

Appl. Opt. 56(3), 607-610 (2017)  View: HTML | PDF

Deformation reconstruction by means of surface optimization. Part I: Time-averaged electronic speckle pattern interferometry

Appl. Opt. 56(3), 654-661 (2017)  View: HTML | PDF

Surface roughness and morphology evolution of optical glass with micro-cracks during chemical etching

Appl. Opt. 56(3), 702-711 (2017)  View: HTML | PDF

Small-size, high-resolution angular displacement measurement technology based on an imaging detector

Appl. Opt. 56(3), 755-760 (2017)  View: HTML | PDF

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