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OSA Publishing

20 May 2018, Volume 57, Issue 15, pp. 3991-4352   45 articles

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Instrumentation, Measurement, and Metrology

Fringe projection system for high-temperature workpieces–design, calibration, and measurement

Appl. Opt. 57(15), 4075-4089 (2018)  View: HTML | PDF

Shape reconstruction based on zero-curl gradient field estimation in a fringe reflection technique

Appl. Opt. 57(15), 4135-4144 (2018)  View: HTML | PDF

Calibration of focusing lens artifacts in a dual rotating-compensator Mueller matrix ellipsometer

Appl. Opt. 57(15), 4145-4152 (2018)  View: HTML | PDF

Local blur analysis and phase error correction method for fringe projection profilometry systems

Appl. Opt. 57(15), 4267-4276 (2018)  View: HTML | PDF

Editors' Pick

Stokes polarimeter performance: general noise model and analysis

Appl. Opt. 57(15), 4283-4296 (2018)  View: HTML | PDF  [Suppl. Mat. (1)]

Correction of phase-delay distortion for α–β circular scanning

Appl. Opt. 57(15), 4309-4315 (2018)  View: HTML | PDF

Optical nondestructive dynamic measurements of wafer-scale encapsulated nanofluidic channels

Appl. Opt. 57(15), 4337-4344 (2018)  View: HTML | PDF

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