Abstract

No abstract available.

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. W. T. Silfvast, Appl. Phys. Letters 13, 169 (1968).
    [CrossRef]
  2. J. P. Goldsborough, IEEE J. Quantum Electron. 5, 133 (1969).
    [CrossRef]
  3. T. P. Sosnowski, J. Appl. Phys. 40, 5138 (1969).
    [CrossRef]
  4. T. A. Shankoff, Appl. Opt. 7, 2101 (1968).
    [CrossRef] [PubMed]
  5. L. H. Lin, Appl. Opt. 9, 963 (1969).
    [CrossRef]
  6. H. Kogelnik, Proc. Symp. Modern Optics (Polytechnic Press, Brooklyn, N.Y., 1967, pp. 605–617).
  7. H. Kogelnik, T. P. Sosnowski, to be published.

1969

J. P. Goldsborough, IEEE J. Quantum Electron. 5, 133 (1969).
[CrossRef]

T. P. Sosnowski, J. Appl. Phys. 40, 5138 (1969).
[CrossRef]

L. H. Lin, Appl. Opt. 9, 963 (1969).
[CrossRef]

1968

W. T. Silfvast, Appl. Phys. Letters 13, 169 (1968).
[CrossRef]

T. A. Shankoff, Appl. Opt. 7, 2101 (1968).
[CrossRef] [PubMed]

Goldsborough, J. P.

J. P. Goldsborough, IEEE J. Quantum Electron. 5, 133 (1969).
[CrossRef]

Kogelnik, H.

H. Kogelnik, Proc. Symp. Modern Optics (Polytechnic Press, Brooklyn, N.Y., 1967, pp. 605–617).

H. Kogelnik, T. P. Sosnowski, to be published.

Lin, L. H.

L. H. Lin, Appl. Opt. 9, 963 (1969).
[CrossRef]

Shankoff, T. A.

Silfvast, W. T.

W. T. Silfvast, Appl. Phys. Letters 13, 169 (1968).
[CrossRef]

Sosnowski, T. P.

T. P. Sosnowski, J. Appl. Phys. 40, 5138 (1969).
[CrossRef]

H. Kogelnik, T. P. Sosnowski, to be published.

Appl. Opt.

Appl. Phys. Letters

W. T. Silfvast, Appl. Phys. Letters 13, 169 (1968).
[CrossRef]

IEEE J. Quantum Electron.

J. P. Goldsborough, IEEE J. Quantum Electron. 5, 133 (1969).
[CrossRef]

J. Appl. Phys.

T. P. Sosnowski, J. Appl. Phys. 40, 5138 (1969).
[CrossRef]

Other

H. Kogelnik, Proc. Symp. Modern Optics (Polytechnic Press, Brooklyn, N.Y., 1967, pp. 605–617).

H. Kogelnik, T. P. Sosnowski, to be published.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (1)

Fig. 1
Fig. 1

The square root of the diffraction efficiency (measured at 633 nm) as a function of exposure for the two wavelengths of the He–Cd laser.

Equations (2)

Equations on this page are rendered with MathJax. Learn more.

2 π · λ · d eff / Λ 2 10 ,
η = sin 2 { const · q · E · ( 1 T ) } ,

Metrics