Abstract

Distortions were measured at thirty-six positions over the photocathodes of four different types of image orthicon tubes operated in a high precision camera system designed for astronomical use. Rms values of distortion for these tubes were found to be of the order of 0.2% to 0.3% of the picture width. Changes in distortion over 16–26-h periods of operation were measured for three tubes and were found to be of the order of 0.02% to 0.03% of the picture width, making it possible to correct astronomical TV images for distortion to within a few parts in 104.

© 1970 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |

  1. J. D. Wray, Final Report, Air Force Contract AF29(601) 6867, 29Sept.1966.
  2. J. A. Hynek, G. Bakos, J. Dunlap, W. Powers, in Advances in Electronics and Electron Physics (Academic Press, N. Y., 1966), Vol. 22B.

Bakos, G.

J. A. Hynek, G. Bakos, J. Dunlap, W. Powers, in Advances in Electronics and Electron Physics (Academic Press, N. Y., 1966), Vol. 22B.

Dunlap, J.

J. A. Hynek, G. Bakos, J. Dunlap, W. Powers, in Advances in Electronics and Electron Physics (Academic Press, N. Y., 1966), Vol. 22B.

Hynek, J. A.

J. A. Hynek, G. Bakos, J. Dunlap, W. Powers, in Advances in Electronics and Electron Physics (Academic Press, N. Y., 1966), Vol. 22B.

Powers, W.

J. A. Hynek, G. Bakos, J. Dunlap, W. Powers, in Advances in Electronics and Electron Physics (Academic Press, N. Y., 1966), Vol. 22B.

Wray, J. D.

J. D. Wray, Final Report, Air Force Contract AF29(601) 6867, 29Sept.1966.

Other

J. D. Wray, Final Report, Air Force Contract AF29(601) 6867, 29Sept.1966.

J. A. Hynek, G. Bakos, J. Dunlap, W. Powers, in Advances in Electronics and Electron Physics (Academic Press, N. Y., 1966), Vol. 22B.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (6)

Fig. 1
Fig. 1

Image Orthicon, type 8092A, initial distortion pattern. Dot pattern outlines the original object grid which was projected on the I.O. photocathode to 1 in. × 1 in. (2.5 cm × 2.5 cm) size overall. Circled dots show final image of grid with all displacements exaggerated by a factor of 10 to show distortions more clearly.

Fig. 2
Fig. 2

Image Orthicon, type OS20F initial distortion pattern. Same conditions as Fig. 1.

Fig. 3
Fig. 3

Image Orthicon, Type 5820, initial distortion pattern. Same conditions as Fig. 1.

Fig. 4
Fig. 4

Image Orthicon, Type 7816, initial distortion pattern. Same conditions as Fig. 1.

Fig. 5
Fig. 5

Image Orthicon, Type 8092A, change in distortion pattern after 26 h of continuous operation. Each vector shows the movement of the corresponding point of the distortion pattern after 26 h. Vectors are drawn from points of the original object grid for clarity, though in actuality they connect corresponding points of the distorted patterns at the beginning and end of the run. Each vector in this figure has been lengthened by a factor of 100 to make it more clearly visible.

Fig. 6
Fig. 6

Image Orthicon, Type OS20F, change in distortion pattern after 16 h of continuous operation. Each vector indicates drift of corresponding points in the pattern after 16 h as in Fig. 5. However, vectors in the above figure have been lengthened by only a factor of 20 in contrast to those of Fig. 5, where a different factor was used.

Tables (1)

Tables Icon

Table I RMS Distortion Values for Five Image Orthicons

Metrics