Abstract

The standard method of determining the index homogeneity of optical-quality glass windows has been extended to improve the accuracy of the results, and to enable disks of over 20 in. (50 cm) in diameter to be evaluated with comparative ease. The evaluation of a 34 in. (85 cm) diameter disk of fused silica illustrates the new method.

© 1969 Optical Society of America

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References

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  1. F. Twyman, J. W. Perry, Proc. Phys. Soc. London 34, 151 (1922).
    [CrossRef]
  2. P. F. Forman, Appl. Opt. 3, 636 (1964).
    [CrossRef]
  3. P. Langenbeck, ICO 8 Conference on Optical Instruments and Techniques, Reading, England, July 1969, paper 49.

1964 (1)

P. F. Forman, Appl. Opt. 3, 636 (1964).
[CrossRef]

1922 (1)

F. Twyman, J. W. Perry, Proc. Phys. Soc. London 34, 151 (1922).
[CrossRef]

Forman, P. F.

P. F. Forman, Appl. Opt. 3, 636 (1964).
[CrossRef]

Langenbeck, P.

P. Langenbeck, ICO 8 Conference on Optical Instruments and Techniques, Reading, England, July 1969, paper 49.

Perry, J. W.

F. Twyman, J. W. Perry, Proc. Phys. Soc. London 34, 151 (1922).
[CrossRef]

Twyman, F.

F. Twyman, J. W. Perry, Proc. Phys. Soc. London 34, 151 (1922).
[CrossRef]

Appl. Opt. (1)

P. F. Forman, Appl. Opt. 3, 636 (1964).
[CrossRef]

Proc. Phys. Soc. London (1)

F. Twyman, J. W. Perry, Proc. Phys. Soc. London 34, 151 (1922).
[CrossRef]

Other (1)

P. Langenbeck, ICO 8 Conference on Optical Instruments and Techniques, Reading, England, July 1969, paper 49.

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Figures (4)

Fig. 1
Fig. 1

Schematic representation of the four measurements: (a) measurement 1, (b) measurement 2, (c) measurement 3, (d) measurement 4.

Fig. 2
Fig. 2

Interferograms of the four measurements: (a) measurement 1, (b) measurement 2, (c) measurement 3, (d) measurement 4.

Fig. 3
Fig. 3

Contour map of Δt. Contours drawn at half-wave intervals.

Fig. 4
Fig. 4

Contour map of Δn. Contours drawn at intervals of 1 × 10−6.

Equations (4)

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measurement 1 , 2 z 1 ; measurement 2 , 2 [ z 1 + n ( z 2 z 1 ) ] ; measurement 3 , 2 [ z 1 + n ( z 2 z 1 ) + ( z 3 z 2 ) ] = 2 [ ( n 1 ) ( z 2 z 1 ) + z 3 ] ; measurement 4 , 2 z 3 .
measurement 2 measurement 1 = 2 Δ ( n t ) = 2 R , measurement 3 measurement 4 = 2 Δ [ ( n 1 ) t ] = 2 T .
Δ t = R T , Δ n = [ n T ( n 1 ) R ] / t ,
t [ ( n / T ) + ] δ T

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