Abstract

The fundamental principles of operation and of the design of a new type of lateral shearing interferometer are described. This instrument has the advantage over existing devices that no computation is required in order to derive the wavefront shape from the interferogram. Instead, (he aberration is obtained directly by measurement of the variation of phase difference at the center of one of the component wavefronts as it is scanned across the other. The technique lends itself readily to automatic recording of wavefront aberration.

© 1969 Optical Society of America

Design of a Wavefront Shearing Interferometer Useful for Testing Large Aperture Optical Systems

E. van Rooyen and H. G. van Houten
Appl. Opt. 8(1) 91-94 (1969)

Single-shot reflective shearing point diffraction interferometer for wavefront measurements

Wenhua Zhu, Lei Chen, Chenfeng Gu, Jun Wan, and Donghui Zheng
Appl. Opt. 54(20) 6155-6161 (2015)

Dual-fiber point diffraction interferometer to measure the wavefront aberration of an imaging system

Peng Feng, Feng Tang, Xiangzhao Wang, Yunjun Lu, Jinghao Xu, Fudong Guo, and Guoxian Zhang
Appl. Opt. 59(10) 3093-3096 (2020)

Evaluation of Large Aberrations Using a Lateral-Shear Interferometer Having Variable Shear

M. P. Rimmer and J. C. Wyant
Appl. Opt. 14(1) 142-150 (1975)

Lens Testing with a Simple Wavefront Shearing Interferometer

D. Nyyssonen and J. M. Jerke
Appl. Opt. 12(9) 2061-2070 (1973)