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References

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  1. L. M. Biberman, Appl. Opt. 6, 1127 (1967).
    [CrossRef] [PubMed]
  2. F. H. Barr, E. H. Eberhardt, Appl. Opt. 6, 1575 (1967).
    [CrossRef] [PubMed]
  3. H. K. Hammond, Appl. Opt. 7, 985 (1968).
    [CrossRef]
  4. G. Kelton et al., Infrared Phys. 3, 139 (1963).
    [CrossRef]
  5. F. E. Nicodemus, “Treatment of Data, Use of Calibration Data,” Section 3 (Lecture No. 17) in “1966 Lectures at the University of Michigan Engineering Summer Conferences,” Sylvania Electronic Systems—Western Division, Mountain View, California, Rep. No. SESW–L41, 15September1996.
  6. “Relative Spectral Response Data for Photosensitive Devices (‘S’ Curves),” formulated by JEDEC Electron Tube Council, JEDEC Publication No. 50, October1964.
  7. “Typical Characteristics of Photosensitive Surfaces,” formulated by JEDEC Electron Tube Council, JEDEC Publication No. 61, December1966.
  8. W. A. Wildhack, R. C. Powell, H. L. Mason, Eds., “Accuracy in Measurements and Calibrations, 1965,” National Bureau of Standards, Technical Note 262, issued June15, 1965; see especially pp. 128–129.
  9. R. Stair, W. E. Schneider, J. K. Jackson, Appl. Opt. 2, 1151 (1963).
    [CrossRef]
  10. I. Wunderman, Appl. Opt. 7, 25 (1968).
    [CrossRef] [PubMed]
  11. I. Wunderman, Cintra Inc.; private communication.
  12. R. Engstrom, RCA-Lancaster; private communication.
  13. L. M. Biberman, Institute for Defense Analyses; private communication.

1968 (2)

1967 (2)

1963 (2)

Barr, F. H.

Biberman, L. M.

L. M. Biberman, Appl. Opt. 6, 1127 (1967).
[CrossRef] [PubMed]

L. M. Biberman, Institute for Defense Analyses; private communication.

Eberhardt, E. H.

Engstrom, R.

R. Engstrom, RCA-Lancaster; private communication.

Hammond, H. K.

Jackson, J. K.

Kelton, G.

G. Kelton et al., Infrared Phys. 3, 139 (1963).
[CrossRef]

Nicodemus, F. E.

F. E. Nicodemus, “Treatment of Data, Use of Calibration Data,” Section 3 (Lecture No. 17) in “1966 Lectures at the University of Michigan Engineering Summer Conferences,” Sylvania Electronic Systems—Western Division, Mountain View, California, Rep. No. SESW–L41, 15September1996.

Schneider, W. E.

Stair, R.

Wunderman, I.

I. Wunderman, Appl. Opt. 7, 25 (1968).
[CrossRef] [PubMed]

I. Wunderman, Cintra Inc.; private communication.

Appl. Opt. (5)

Infrared Phys. (1)

G. Kelton et al., Infrared Phys. 3, 139 (1963).
[CrossRef]

Other (7)

F. E. Nicodemus, “Treatment of Data, Use of Calibration Data,” Section 3 (Lecture No. 17) in “1966 Lectures at the University of Michigan Engineering Summer Conferences,” Sylvania Electronic Systems—Western Division, Mountain View, California, Rep. No. SESW–L41, 15September1996.

“Relative Spectral Response Data for Photosensitive Devices (‘S’ Curves),” formulated by JEDEC Electron Tube Council, JEDEC Publication No. 50, October1964.

“Typical Characteristics of Photosensitive Surfaces,” formulated by JEDEC Electron Tube Council, JEDEC Publication No. 61, December1966.

W. A. Wildhack, R. C. Powell, H. L. Mason, Eds., “Accuracy in Measurements and Calibrations, 1965,” National Bureau of Standards, Technical Note 262, issued June15, 1965; see especially pp. 128–129.

I. Wunderman, Cintra Inc.; private communication.

R. Engstrom, RCA-Lancaster; private communication.

L. M. Biberman, Institute for Defense Analyses; private communication.

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Figures (1)

Fig. 1
Fig. 1

Relative spectral responsivity r(λ) [shown as relative sensitivity] as function of wavelength [1 Å = 101μm] for a device with S–4 response. (Reproduced from Ref. 6.)

Equations (11)

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I = 0 Φ λ ( λ ) R ( λ ) d λ [ A ] .
R a = I / Φ = 0 Φ λ ( λ ) R ( λ ) d λ 0 Φ 0 ( λ ) d λ [ A · W - 1 ] .
φ λ ( λ ) = Φ λ ( λ ) / Φ λ ( λ p ) [ dimensionless ]
r ( λ ) = R ( λ ) / R ( λ m ) [ dimensionless ] ,
R a = R ( λ m ) 0 φ λ ( λ ) r ( λ ) d λ 0 φ λ ( λ ) d λ [ A · W - 1 ] .
Φ n = I / R ( λ m ) [ peak normalized W ] .
Φ λ ( λ p ) = Φ n / 0 φ λ ( λ ) r ( λ ) d λ [ W · μ m - 1 ] ,
R t w = R t l 0 φ λ ( λ ) d λ 0 φ λ ( λ ) r ( λ ) d λ [ A · W - 1 ] ,
R ( λ m ) = R t w 0 φ λ ( λ ) d λ 0 φ λ ( λ ) r ( λ ) d λ [ A · W - 1 ] ,
R ( λ ) = R ( λ m ) r ( λ ) [ A · W - 1 ] .
R ( λ m ) = I / 0 Φ λ ( λ ) τ ( λ ) r ( λ ) d λ [ A · W - 1 ] ,

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