Abstract

The theoretical background for a type of common path interferometer, the so-called axial twist interferometer, is discussed. Two devices capable of producing axially twisted bundles of rays are illustrated. Applications of the system are suggested with particular reference to interference microscopy. A simpler, related device, the planar inversion interferometer, is also described, and the characteristics and applicability of the two instruments are compared.

© 1968 Optical Society of America

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References

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  1. J. B. Saunders, Appl. Opt. 6, 1581 (1967).
    [CrossRef] [PubMed]
  2. M. V. R. K. Murty, E. C. Hagerott, Appl. Opt. 5, 615 (1966).
    [CrossRef] [PubMed]
  3. M. Françon, in Progress in Microscopy (Pergamon Press, New York, 1961), pp. 107–109, 113–117.
  4. W. Kosters, Interferenzdoppelprisma für Messzwecke, German Pat.595211 (1934).

1967 (1)

1966 (1)

Françon, M.

M. Françon, in Progress in Microscopy (Pergamon Press, New York, 1961), pp. 107–109, 113–117.

Hagerott, E. C.

Kosters, W.

W. Kosters, Interferenzdoppelprisma für Messzwecke, German Pat.595211 (1934).

Murty, M. V. R. K.

Saunders, J. B.

Appl. Opt. (2)

Other (2)

M. Françon, in Progress in Microscopy (Pergamon Press, New York, 1961), pp. 107–109, 113–117.

W. Kosters, Interferenzdoppelprisma für Messzwecke, German Pat.595211 (1934).

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Figures (5)

Fig. 1
Fig. 1

Ray specified by cylindrical coordinates r, θ, α, β.

Fig. 2
Fig. 2

Simple π twister.

Fig. 3
Fig. 3

π twister, second design.

Fig. 4
Fig. 4

(a) Inverter device, (b) two components of an inverter, (c) two components of a direct vision inverter.

Fig. 5
Fig. 5

Fig. 5(a) and (b). Image doubling in the fields of view of the axial twist and the planar inversion interference microscopes.

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