Abstract

The theoretical background for a type of common path interferometer, the so-called axial twist interferometer, is discussed. Two devices capable of producing axially twisted bundles of rays are illustrated. Applications of the system are suggested with particular reference to interference microscopy. A simpler, related device, the planar inversion interferometer, is also described, and the characteristics and applicability of the two instruments are compared.

© 1968 Optical Society of America

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