Abstract

This paper presents a technique to measure the relative scatter of x-ray reflecting surfaces. Scatter measurements were performed on fused silica, Cer-Vit, beryllium, Kanigen, steel, and silicon. Fused silica surfaces consistently produced the least scatter, while beryllium produced the greatest scatter (4× that of silica), with the other materials being intermediate and approximately equivalent (about 2× as much scatter as silica).

© 1968 Optical Society of America

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