Abstract

We explore an active illumination approach to remote material recognition, based on quantum parametric mode sorting and single-photon detection. By measuring a photon’s time of flight at picosecond resolution, 97.8% recognition is demonstrated by illuminating only a single point on the materials. Thanks to the exceptional detection sensitivity and noise rejection, a high recognition accuracy of 96.1% is achieved even when the materials are occluded by a lossy and multiscattering obscurant.

© 2021 Optical Society of America

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