Abstract

Transmittance and reflectance measurements on wirecloth and electroformed metallic meshes are presented in the region 0.01 ≤ λ/d ≤ 5. The results were obtained under equal geometric optical conditions with a vacuum grating spectrometer. The measurements are used for the construction of a transmission bandpass filter in the wavenumber region ν > 18 cm−1. In order to be able to construct a bandpass filter in the entire far ir, a reciprocal grid is investigated and found to be suitable as a transmission low pass filter characterized only by geometrical parameters.

© 1967 Optical Society of America

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References

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  1. A. Mitsuishi, Y. Otsuka, S. Fujita, H. Yoshinaga, Japan. J. Appl. Phys. 2, 574 (1963).
    [CrossRef]
  2. K. F. Renk, L. Genzel, Appl. Opt. 1, 643 (1962).
    [CrossRef]
  3. Y. Yamada, A. Mitsuishi, H. Yoshinaga, J. Opt. Soc. Am. 52, 17 (1962).
    [CrossRef]
  4. H. H. Theissing, P. J. Caplan, J. Opt. Soc. Am. 46, 971 (1956).
    [CrossRef]
  5. P. Vogel, L. Genzel, Infrared Phys. 4, 257 (1964).
    [CrossRef]
  6. K. D. Möller, D. J. McMahon, D. R. Smith, Appl. Opt. 5, 403 (1966).
    [CrossRef] [PubMed]
  7. Private communication.
  8. K. D. Möller, V. P. Tomaselli, L. R. Scube, B. K. McKenna, J. Opt. Soc. Am. 55, 1233 (1965).
    [CrossRef]
  9. R. Ulrich, K. F. Renk, L. Genzel, Trans. IEEE MTT-11, 363 (1963).
  10. R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
    [CrossRef]
  11. Private communication.
  12. P. L. Richards, J. Opt. Soc. Am. 54, 1474 (1964).
    [CrossRef]
  13. R. G. Wheeler, J. C. Hill, J. Opt. Soc. Am. 56, 657 (1966).
    [CrossRef]
  14. R. Ulrich, Infrared Phys.7, in press (1967).

1966 (2)

1965 (1)

1964 (2)

P. Vogel, L. Genzel, Infrared Phys. 4, 257 (1964).
[CrossRef]

P. L. Richards, J. Opt. Soc. Am. 54, 1474 (1964).
[CrossRef]

1963 (2)

R. Ulrich, K. F. Renk, L. Genzel, Trans. IEEE MTT-11, 363 (1963).

A. Mitsuishi, Y. Otsuka, S. Fujita, H. Yoshinaga, Japan. J. Appl. Phys. 2, 574 (1963).
[CrossRef]

1962 (2)

1956 (1)

1952 (1)

R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
[CrossRef]

Bell, E. E.

R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
[CrossRef]

Caplan, P. J.

Fujita, S.

A. Mitsuishi, Y. Otsuka, S. Fujita, H. Yoshinaga, Japan. J. Appl. Phys. 2, 574 (1963).
[CrossRef]

Genzel, L.

P. Vogel, L. Genzel, Infrared Phys. 4, 257 (1964).
[CrossRef]

R. Ulrich, K. F. Renk, L. Genzel, Trans. IEEE MTT-11, 363 (1963).

K. F. Renk, L. Genzel, Appl. Opt. 1, 643 (1962).
[CrossRef]

Hanler, R. L.

R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
[CrossRef]

Haynie, W. H.

R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
[CrossRef]

Hill, J. C.

McKenna, B. K.

McMahon, D. J.

Mitsuishi, A.

A. Mitsuishi, Y. Otsuka, S. Fujita, H. Yoshinaga, Japan. J. Appl. Phys. 2, 574 (1963).
[CrossRef]

Y. Yamada, A. Mitsuishi, H. Yoshinaga, J. Opt. Soc. Am. 52, 17 (1962).
[CrossRef]

Möller, K. D.

Oetjen, R. A.

R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
[CrossRef]

Otsuka, Y.

A. Mitsuishi, Y. Otsuka, S. Fujita, H. Yoshinaga, Japan. J. Appl. Phys. 2, 574 (1963).
[CrossRef]

Renk, K. F.

R. Ulrich, K. F. Renk, L. Genzel, Trans. IEEE MTT-11, 363 (1963).

K. F. Renk, L. Genzel, Appl. Opt. 1, 643 (1962).
[CrossRef]

Richards, P. L.

Schauwecker, H. E.

R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
[CrossRef]

Scube, L. R.

Smith, D. R.

Theissing, H. H.

Tomaselli, V. P.

Ulrich, R.

R. Ulrich, K. F. Renk, L. Genzel, Trans. IEEE MTT-11, 363 (1963).

R. Ulrich, Infrared Phys.7, in press (1967).

Vogel, P.

P. Vogel, L. Genzel, Infrared Phys. 4, 257 (1964).
[CrossRef]

Ward, W. M.

R. A. Oetjen, W. H. Haynie, W. M. Ward, R. L. Hanler, H. E. Schauwecker, E. E. Bell, J. Opt. Soc. Am. 42, 599 (1952).
[CrossRef]

Wheeler, R. G.

Yamada, Y.

Yoshinaga, H.

A. Mitsuishi, Y. Otsuka, S. Fujita, H. Yoshinaga, Japan. J. Appl. Phys. 2, 574 (1963).
[CrossRef]

Y. Yamada, A. Mitsuishi, H. Yoshinaga, J. Opt. Soc. Am. 52, 17 (1962).
[CrossRef]

Appl. Opt. (2)

Infrared Phys. (1)

P. Vogel, L. Genzel, Infrared Phys. 4, 257 (1964).
[CrossRef]

J. Opt. Soc. Am. (6)

Japan. J. Appl. Phys. (1)

A. Mitsuishi, Y. Otsuka, S. Fujita, H. Yoshinaga, Japan. J. Appl. Phys. 2, 574 (1963).
[CrossRef]

Trans. IEEE (1)

R. Ulrich, K. F. Renk, L. Genzel, Trans. IEEE MTT-11, 363 (1963).

Other (3)

Private communication.

R. Ulrich, Infrared Phys.7, in press (1967).

Private communication.

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Figures (8)

Fig. 1
Fig. 1

(a) Sample position at exit of a light pipe and beam opening. (b) Angle of incidence for the reflection measurements.

Fig. 2
Fig. 2

Transmittance and reflectance measurements (same scale in percent) for wirecloth meshes of #200 (T1, R1), #120 (T2, R1), #50 (T3, R3), as a function of λ/d.

Fig. 3
Fig. 3

Transmittance and reflectance of a No. 400 wirecloth mesh as a function of λ/d.

Fig. 4
Fig. 4

Schematic of a wirecloth mesh and explanation of the parameters d, b, t.

Fig. 5
Fig. 5

Transmittance and reflectance curves of electroformed meshes #250 (T1, R1) and #500 (T2, T2) as a function of λ/d.

Fig. 6
Fig. 6

Transmittance and reflectance curves of electroformed meshes No. 100 (T1, R1) and No. 50 (T2, R2) as a function of λ/d.

Fig. 7
Fig. 7

Transmittance of the bandpath filter as a function of wavenumber.

Fig. 8
Fig. 8

Transmittance and reflectance of a reciprocal grid of areas 31 μ × 31 μ and 18 μ separated, on a crystal quartz substrate.

Tables (2)

Tables Icon

Table I Parameters of Wirecloth Meshes. Mesh Number in Lines Per In., d Distance Between Successive Wires (Periodicity Constant) in μ, a Wire Diam in μa

Tables Icon

Table II Parameters of Electroformed Meshes d, b, t as Explained in Fig. 4, in μ

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