Abstract

We investigated the low-frequency optical and electrical noise characteristics and their cross-correlation factor of the 808 nm laser diodes (LDs) samples, whose performances were degraded and stabilized after operating a period of time or during ex-factory reliability lifetime tests. It was shown that the optical noise in unreliable samples exhibited white components in the frequency range from 1 kHz to 10 kHz, while a Lorentzian-type component was superimposed on ${1\!/\!}f$ electrical noise. Meanwhile, the optical and electrical noise correlation exhibited positive result. In contrast, both low-frequency optical and electrical noise presented pure ${1\!/\!}f$-type fluctuations in stable samples. These presented results suggest that it is feasible to employ low-frequency noise measurements as a tool for predicting and diagnosing the reliability of LDs.

© 2020 Optical Society of America

1/f noise analysis of 980 nm InGaAs/GaAs laser diodes below the lasing threshold

Xiaojuan Chen and Chang Qu
Appl. Opt. 59(3) 628-634 (2020)

Micro-integrated high-power narrow-linewidth external-cavity tapered diode laser at 808 nm

Mingjun Chi, André Müller, Anders K. Hansen, Ole B. Jensen, Paul M. Petersen, and Bernd Sumpf
Appl. Opt. 59(2) 295-299 (2020)

Microsecond pulse-mode operation of a micro-integrated high-power external-cavity tapered diode laser at 808 nm

Mingjun Chi, André Müller, Anders K. Hansen, Ole B. Jensen, Paul M. Petersen, and Bernd Sumpf
Appl. Opt. 59(26) 7836-7840 (2020)

808-nm diode-pumped continuous-wave Tm:GdVO₄ laser at room temperature

Yoshiharu Urata and Satoshi Wada
Appl. Opt. 44(15) 3087-3092 (2005)

Extended cavity diode laser master-oscillator-power-amplifier for operation of an iodine frequency reference on a sounding rocket

Ch. Kürbis, A. Bawamia, M. Krüger, R. Smol, A. Peters, A. Wicht, and G. Tränkle
Appl. Opt. 59(2) 253-262 (2020)