Abstract

We present an empirical master–slave dual-source configuration within the diffusion approximation that enhances modeling of spatially resolved diffuse reflectance at short-path and with low scattering from a semi-infinite homogeneous medium when irradiated by a pencil beam. An isotropic virtual source positioned at a depth of 1/(reduced scattering coefficient) is used as the master source. A second isotropic virtual source whose depth and intensity depend upon those of the master source and tissue property according to a set of simple empirical formulas is added as the slave source. When tested for a semi-infinite homogeneous medium, this master–slave dual-source model consistently produces the aggressive peaking of the diffuse reflectance toward the point of entry, which is significantly underestimated by the model prediction that involves only the master source. Monte Carlo simulations have shown the effectiveness of this empirical model at a short source–detector separation of 1/100 of 1/(reduced scattering coefficient) and an absorption to reduced scattering ratio as strong as 1, with an error within 20% in the near field (1/10 of 1/(reduced scattering coefficient)).

© 2017 Optical Society of America

Full Article  |  PDF Article

Corrections

Daqing Piao and Sanjay Patel, "Simple empirical master-slave dual-source configuration within the diffusion approximation enhances modeling of spatially resolved diffuse reflectance at short-path and with low-scattering from a semi-infinite homogeneous medium: erratum," Appl. Opt. 57, 7942-7942 (2018)
https://www.osapublishing.org/ao/abstract.cfm?uri=ao-57-27-7942

OSA Recommended Articles
Virtual-source diffusion approximation for enhanced near-field modeling of photon-migration in low-albedo medium

Mengyu Jia, Xueying Chen, Huijuan Zhao, Shanshan Cui, Ming Liu, Lingling Liu, and Feng Gao
Opt. Express 23(2) 1337-1352 (2015)

Experimental tests of a simple diffusion model for the estimation of scattering and absorption coefficients of turbid media from time-resolved diffuse reflectance measurements

Steen J. Madsen, Brian C. Wilson, Michael S. Patterson, Young D. Park, Steven L. Jacques, and Yaron Hefetz
Appl. Opt. 31(18) 3509-3517 (1992)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (15)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription