Abstract

Fringe projection profilometry (FPP) has been widely used for three-dimensional reconstruction, surface measurement, and reverse engineering. However, FPP is prone to overexposure if objects have a wide range of reflectance. In this paper, we propose a dynamic projection theory based on FPP to rapidly measure the overexposed region with an attempt to conquer this challenge. This theory modifies the projected fringe image to the next better measurement based on the feedback provided by the previously captured image intensity. Experiments demonstrated that the number of overexposed points can be drastically reduced after one or two iterations. Compared with the state-of-the-art methods, our proposed dynamic projection theory measures the overexposed region quickly and effectively and, thus, broadens the applications of FPP.

© 2017 Optical Society of America

Optimal frequency selection for accuracy improvement in binary defocusing fringe projection profilometry

Jiangping Zhu, Xiaoyi Feng, Changhui Zhu, and Pei Zhou
Appl. Opt. 61(23) 6897-6904 (2022)

Calibration method for projector-camera-based telecentric fringe projection profilometry system

Haibo Liu, Huijing Lin, and Linshen Yao
Opt. Express 25(25) 31492-31508 (2017)

Accurate and robust calibration method based on pattern geometric constraints for fringe projection profilometry

Peng Lu, Changku Sun, Bin Liu, and Peng Wang
Appl. Opt. 56(4) 784-794 (2017)

Self-correction of projector nonlinearity in phase-shifting fringe projection profilometry

Fuxing Lü, Shuo Xing, and Hongwei Guo
Appl. Opt. 56(25) 7204-7216 (2017)

Reconstruction method for fringe projection profilometry based on light beams

Xuexing Li, Zhijiang Zhang, and Chen Yang
Appl. Opt. 55(34) 9895-9906 (2016)